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  • Chemistry  (18)
  • Acetyl chloride, trichloro-  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Vacuum pyrolysis of CCl"3COCl: Matrix-IR and mass spectrometric studies of the intermediates
    Amsterdam : Elsevier
    Journal of Analytical and Applied Pyrolysis 13 (1988), S. 135-140 
    Details
    ISSN: 0165-2370
    Keywords: Acetyl chloride, trichloro- ; mass spectrometry ; matrix-IR spectroscopy ; pyrolysis.
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0165-2370(88)80053-6
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  • 2
    Electronic Resource
    Electronic Resource
    Particle-beam treatment of organosilicon gas separation membranes: A novel way of controlling their mass transport properties (1996)
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 60 (1996), S. 1883-1889 
    Details
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Fast atom bombardment applied in the low keV energy range to organosilicon gas separation membranes was found to modify their mass transport properties in a controllable manner. In particular, asymmetric polyvinyltrimethylsilane membranes and polydimethylsiloxane-based composite ones were treated by particle beams obtained from various gases like Ar, He, H2, and NH3, with particle energies of about 1 keV and does of about 1015 particles cm-2. In each case, improvements in the component selectivities for various gas mixtures coupled with decreases in the component permeances were obtained. The extent of mod-ification of the mass transport properties increased with increase of the calculated average depth of penetration of the bombarding particles. The modification of the mass transport properties was considered to take place as a result of compaction of the surface layer due to reaction like crosslinking and loss of pendant groups. © 1996 John Wiley & Sons, Inc.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
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    Paper (German National Licenses)
  • 3
    Electronic Resource
    Electronic Resource
    Surface characterization of the deactivation of alumina catalysts used for COS synthesis (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 12 (1988), S. 262-268 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: One of the possible routes of producing COS, an important material in organic synthese, is the CO2 + CS2 ⇄ 2COS reaction, preferably over gamma-alumina catalysts. Under long-term loading, however, a remarkable loss of the catalytic activity occurs.The nature of the ageing process was studied by a multi-technique apporach on high purity [I] and on a commerical grade [II] gamma-alumina, which latter contained Na, Ca, and S as surface impurities.On catalyst [I] weak chemisorption of CO2, CS2 and COS was observed by the volumetric method, as characterized by the isosteric heats of adsorption. Catalyst [II] chemisorbed CO2 and COS but not CS2 and showed much less catalytic activity. Gravimetric measurements have shown that adsorption of CS2 and COS leads to the surface deposition of side products. XPS studies on new, loaded and aged samples have revealed that the ageing of the catalyst is primarily caused by the deposition of sulphur and carbon with carbon in excess, presumably in C—S, C—S and C—C environements.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740120407
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  • 4
    Electronic Resource
    Electronic Resource
    XPS study of ion-induced changes on the surface of an organosilicon model polymer (1985)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 7 (1985), S. 282-288 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Changes in composition and bonding induced by bombardment with argon or nitrogen ions in a commercial poly-methyl-phenyl-cyanopropyl-siloxane fluid were examined by XPS. The actual surface composition depended on the ion energy, the etch time and the nature of the gas applied. It was found that phenyl groups were damaged seriously, reaction of the cyano groups took place with the formation of —C=N— type bonds and the polymer degraded with elimination of fragments containing mostly C at the first stage and mainly O and Si at advanced stages. In addition nitrogen was found to build into the polymer surface when bombarding by nitrogen ions. Irreversible changes in the spectra of the fluid polymer were regarded as a sign of crosslinking.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740070606
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  • 5
    Electronic Resource
    Electronic Resource
    XPS study of the state of oxygen on a chemically treated glass surfacePaper presented at ECASIA 89, Antibes, France, 23-27 October 1989. (1990)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 15 (1990), S. 364-368 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The O 1s line of an ordinary, untreated glass surface and of a glass surface in its dealkalized state were studied by XPS. One single O 1s peak was detected on the dealkalized sample at a binding energy (BE) of 532.5 eV while on the alkali-containing sample, and also on the dealkalized sample after alkali solution treatment, a second peak at 531.1 eV BE also could be detected. Experimental data were backed by semi-empirical quantum chemical calculations. The observed low BE component of the O 1s line, according to the outlined experimental evidence, is connected with the presence of alkali ions. This clearly contradicts earlier publications, interpreting the O 1s line as originating from oxygen atoms in bridging and non-bridging positions.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740150604
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  • 6
    Electronic Resource
    Electronic Resource
    XPS studies on intermetallic phases formed in Al—Ni and Al—Mn thin films (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 19 (1992), S. 457-463 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Thin films of Al—Ni and Al—Mn alloys were prepared by high-temperature successive vapour deposition (HTSVD). In the case of Al—Ni a pronounced shift (∼0.5 eV) of the Ni Auger parameter [combined Ni 2p binding energy (BE) and Ni L3 VV kinetic energy (KE) values] to lower values can be detected for the Al3Ni compound, the structure of which was determined by x-ray diffraction. In the Al—Mn system a quasi-crystalline Al4Mn phase was formed and its structure was determined by selected area electron diffraction as well as by TEM and cross-sectional TEM. XPS measurements show that for this Al—Mn phase only a small peak shift (∼0.3 eV) of the Mn 2p core level can be related to the compound formation as compared to the pure metallic state of the components. The same shift to lower values was also obtained for the Auger parameter (Mn 2p BE + Mn L3M23M23). The small peak observed by others at 2.4 eV higher than the Al 2p BE is unambiguously related to the oxygen content in our samples. On the basis of the results we can conclude that the observed core level and Auger line shifts; the small linewidths and especially the Auger parameter shift to lower values are all indicative of the formation of intermetallic compounds in these systems.
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740190186
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  • 7
    Electronic Resource
    Electronic Resource
    Surface and in-depth chemical characterization of sputter-deposited Cr—Si—O layers by XPS and AES techniques (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 19 (1992), S. 453-456 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: RF-sputtered Cr—Si—O cermet films deposited without and with a bias (200 V) have been studied by XPS and AES. Samples as deposited, etched by HF solution as well as annealed at temperatures up to 600°C have been considered. XPS results showed that the surface of the as-received samples were depleted in Cr and enriched in O with respect to the target composition. Silicon and Cr were present in both oxidized and reduced forms in the surface layer. Ar+ ion sputter profiles revealed that the composition of the subsurface approached that of the target and that Cr was present in the subsurface in reduced and Si in both oxidized and reduced states. AES in-depth profiling resulted in element concentration trends similar to but element ratios different from those observed by XPS. This was attributed to preferential sputtering coupled with the significantly different sampling depths of the two techniques. Cr3Si was identified by x-ray diffraction in samples treated at 600°C, but not even traces of it could be detected by this method below 400°C. The Si Auger parameter determined by XPS proved to be more sensitive in identifying silicide-type bonds in the Cr—Si—O layers studied.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740190185
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  • 8
    Electronic Resource
    Electronic Resource
    XPS study on the thermal degradation of poly-N,N′/4,4′-diphenylether/pyromellitimidePaper presented at Ecasia 85, European Conference on Applications of Surface and Interface Analysis, Veldhoven, October 1985. (1986)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 8 (1986), S. 261-266 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Thin foil samples of the title polymer preheated in vacuo up to different temperatures with the highest one reaching 1200 K were analysed by XPS. On heat treatment the surface content of oxygen decreased and that of carbon increased monotonously, while that of nitrogen passed over a local maximum at c. 800 K. Ether-type oxygens proved to be more heat resistant than carbonyl type ones. From the change of the N 1s peak the probable mechanism of decomposition up to c. 800 K was inferred to be a decarboxylation to give —CH=N— type structures. At higher temperatures decarbonylation of the imide groups appeared to become predominant, resulting in the formation of amide functionalities. The development of a conductive (polyaromatic) structure was deduced from the gradual decrease in the charge shift with the increase of the temperature of pretreatment.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740080608
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  • 9
    Electronic Resource
    Electronic Resource
    Surface chemical changes in PVD TiN layers induced by ion bombardment (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 467-473 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: TiN layers produced by the PVD method were subjected to bombardment by different ion species applied in sequence. The relative atomic concentration and the chemical states of the elements in the surface layer were determined by means of x-ray photoelectron spectroscopy. The composition and chemical states of a reference sample after wet chemical etching were taken to be representative for the stoichiometric TiN not affected by ion sputtering. For this sample characteristic line energies of Ti 2p3/2 = 454.7 eV and N 1s = 396.7 eV were found. Alternate bombardment with Ar+, N2O+ ions (1-5 keV) results in significant compositional and chemical state changes. Ar+ bombardment leads to preferential loss of N from the outermost (1-3 nm) surface layers of the nearly stoichiometric TiNx (x = 1.0-1.1) without observable changes in the chemical state of the constituents. Bombardment with N2+ ions leads to a build-up of excess N (x ≫ 1) followed by the appearance of new N 1s and Ti 2p lines at 395.8 ± 0.3 eV and at 456.3 ± 0.3 eV, respectively. N2O+ bombardment increases the O and decreases the N concentration together with a concomitant shot out of a Ti 2p3/2 component peak at about 457.6 eV assignable to Ti2O3.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740210626
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  • 10
    Electronic Resource
    Electronic Resource
    Electronic state and catalytic activity of SiO2 doped γ-Al2O3 (1986)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 9 (1986), S. 237-241 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Silica-alumina catalysts have been applied for a long time in cracking and reforming reactions. Lewis type surface sites are generally accepted to serve as active centers. In this respect, surface properties of these materials are of main concern. In the present work SiO2 doped γ-Al2O3 with less than a monolayer coverage were prepared by the reaction of SiCl4 (g) with γ-Al2O3 at 820-1120 K. Catalytic activity of the samples was tested by a model reaction of n-hexane cracking. Surface composition and electronic state were evaluated by XPS investigations performed on a KRATOS XSAM 800 instrument. Catalytic activity (conversion) varies remarkably with increasing Si content showing a sharp maximum at low Si coverage. The observed shift of Al 2p lines with increasing Si content is interpreted as an enhancement of the acceptor or acidic character of the surface Al atoms. The Auger parameter for Si(α'Si), (composed by addition of Si 2p BE and Si (KLL) KE values) passes also through a maximum at the same Si-content, as does the conversion curve. A close correlation of the Auger parameter and the catalytic activity is established for samples with (Si/Al)≲7%. This leads to a conclusion, that the rise in extra-atomic relaxation energy may serve as an additional indication of enhanced catalytic activity.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740090407
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