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Description of low-energy peak distortion observed in X-ray spectrometry with Si(Li) detectors (1987)

Heckel, J. ; Scholz, W.

New York, NY [u.a.] : Wiley-Blackwell

X-Ray Spectrometry 16 (1987), S. 181-185

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ISSN: 0049-8246

Keywords: Chemistry ; Analytical Chemistry and Spectroscopy

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Physics

Notes: A simple model is developed to describe the shape and intensity of the low-energy peak distortion measured with Si(Li) detectors in X-RAY SPECTROMETRY. Based on this model, a method is outlined for correcting the distortion channel by channel, which drastically reduces the expense of the deconvolution of the pulse-height spectra measured in energy-dispersive X-ray emission analysis with Si(Li) detectors.

Additional Material: 5 Ill.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1002/xrs.1300160409

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