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  • 1
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Biochimica et Biophysica Acta (BBA)/Biomembranes 769 (1984), S. 370-376 
    ISSN: 0005-2736
    Keywords: Dielectric behavior ; Lipid bilayer ; Membrane capacitance ; Monooleyl phosphate
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Biology , Chemistry and Pharmacology , Medicine , Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Biochimica et Biophysica Acta (BBA)/Molecular Cell Research 1010 (1989), S. 49-55 
    ISSN: 0167-4889
    Keywords: (Mouse erythrocyte) ; (Mouse lymphocyte) ; Dielectric behavior ; Membrane capacitance
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Biology , Chemistry and Pharmacology , Medicine , Physics
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1435-1536
    Keywords: Bias-voltage effect ; concentration polarization ; dielectric relaxation ; electrodialysis ; ion-exchange membrane
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract As the application of a dielectric theory proposed previously (J Membrane Sci 64:153–161 (1991)), theoretical formulation and the practical procedure of dielectric analysis are developed to calculate the structural parameters such as the conductivity gradient and the thickness of the concentration polarization layer, the capacitances and the conductances of the two adjoining aqueous phases from the observed dielectric parameters. The procedure of calculation consequent upon the theoretical formulation was applied to double relaxation data observed for cation-exchange membrane systems under application of d.c. bias voltage. As a consequence, the structural parameters of concentration polarization were readily obtained with accuracy.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 659-666 
    ISSN: 0142-2421
    Keywords: XPS ; nanogranular materials ; Co-Al-N ; magnetic materials ; thin film ; nano-composite ; x-ray diffraction ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Thin (Co0.8Al0.2)100-xNx (x=0-30 at.%) alloy films prepared by a reactive radio frequency (r.f.) sputtering method were characterized by XPS and x-ray diffraction (XRD). The film with no nitrogen consisted of a CsCl-type CoAl metallic compound, while the nitrogen-containing alloys were composed of very fine AlN and face-centred cubic (fcc) Co phases. The quantitative XPS analysis under an assumption of uniform distribution of all the elements resulted in much lower concentrations of Co and higher concentrations of Al and N in comparison with the bulk composition for the nitrogen-containing alloys. By taking account of the granular structure of the alloy films, i.e. the nanoscale particles of fcc Co embedded in the AlN compound, the results of quantitative XPS analysis were explained successfully. Moreover, the thickness of the AlN layer and the size of the fcc Co particles were also able to be estimated under the nanoscale structure models. The results were in good agreement with observation by transmission electron microscopy, especially when a nanostructure model was adopted where nanoscale Co-N particles are dispersed in AlN matrix in a simple cubic-like arrangement. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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