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  • 1
    Electronic Resource
    Electronic Resource
    Calculations of electron inelastic mean free paths for 31 materials (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 11 (1988), S. 577-589 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: We present new calculations of electron inelastic mean free paths (IMFPs) for 200-2000 eV electrons in 27 elements (C, Mg, Al, Si, Ti, V, Cr, Fe, Ni, Cu, Y, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Os, Ir, Pt, Au and Bi) and four compounds (LiF, SiO2, ZnS and Al2O3). These calculations are based on an algorithm due to Penn which makes use of experimental optical data (to represent the dependence of the inelastic scattering probability on energy loss) and the theoretical Lindhard dielectric function (to represent the dependence of the scattering probability on momentum transfer). Our calculated IMFPs were fitted to the Bethe equation for inelastic electron scattering in matter; the two parameters in the Bethe equation were then empirically related to several material constants. The resulting general IMFP formula is believed to be useful for predicting the IMFP dependence on electron energy for a given material and the material-dependence for a given energy. The new formula also appears to be a reasonable but more approximate guide to electron attenuation lengths.
    Additional Material: 14 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740111107
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  • 2
    Electronic Resource
    Electronic Resource
    Calculations of electron inelastic mean free paths. III. Data for 15 inorganic compounds over the 50-2000 eV range (1991)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 17 (1991), S. 927-939 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: We report calculations of electron inelastic mean free aths (IMEPs) of 50-2000 eV electrons in a group of 15 inorganic compounds (Al2O3, GaAs, GaP, InAs, InP, InSb, KCl, LiF, NaCl, PbTe, SiC, Si3N4, SiO2 and ZnS). As was found in similar calculations for a group of 27 elements, there are substantial differences in the shapes of the IMFP versus energy curves from compound to compound for energies below 200 eV; these differences are associated with the different inelastic electron scattering characteristics of each material. Comparisons are made of the calculated IMFPs and the values calculated from the predictive IMFP formula TPP-2 developed from the IMFP calculations for the elements. Deviations in this comparison are found, which correlated with uncertainties of the optical data from which the IMFPs were calculated. The TPP-2 IMFP formula is therefore believed to be a more reliable means for determining IMFPs for these compounds than the direct calculations.
    Additional Material: 21 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740171305
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  • 3
    Electronic Resource
    Electronic Resource
    Activities of the ASTM committee E-42 on surface analysis (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 19 (1992), S. 237-240 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The ASTM Committee E-42 on Surface Analysis was formed in 1976 to advance the field of surface analysis and the quality of surface analyses through the development of appropriate standards (reference procedures, reference materials and reference data), round robins, symposia, workshops and publications. A major function of the Committee is the development of documentary standards or reference procedures. This article contains a brief summary of Committee activities, with emphasis on the reference procedures that have been published and those that are under development.
    Additional Material: 3 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740190146
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  • 4
    Electronic Resource
    Electronic Resource
    Formalism and parameters for quantitative surface analysis by Auger electron spectroscopy and x-ray photoelectron spectroscopy (1993)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 20 (1993), S. 771-786 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: It has been realized during the last 5 years that quantitative surface analyses by Auger electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS) can be greatly complicated by the effects of elastic electron scattering. These effects had previously been largely ignored. We review here the effects of elastic scattering in the formalism of quantitative surface analysis by AES and XPS and discuss the various definitions of terms (inelastic mean free path, attenuation length and escape depth) that have been used to describe inelastic scattering and the surface sensitivities of various electron spectroscopies. We show how a realistic theoretical model of electron transport that includes elastic electron scattering can be related, for some analytical situations, to the common simple formalism of AES and XPS in which elastic scattering is neglected. We consider specifically measurements of overlayer thickness, determination of surface composition for a homogeneous surface region and estimation of the average depth of analysis and we indicate which parameter describing inelastic scattering can be utilized in the simple formalism for these applications. Information is given on sources of data for the inelastic mean free path and the attenuation length. Finally, we point out that the definitions of some terms are undergoing revision as a result of recent scientific developments and to avoid inconsistencies with established usage in other fields.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740200906
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  • 5
    Electronic Resource
    Electronic Resource
    Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50-2000 eV range (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 165-176 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: We report calculations of electron inelastic mean free paths (IMFPs) of 50-2000 eV electrons for a group of 14 organic compounds: 26-n-paraffin, adenine, β-carotene, bovine plasma albumin, deoxyribonucleic acid, diphenylhexatriene, guanine, kapton, polyacetylene, poly(butene-1-sulfone), polyethylene, polymethylmethacrylate, polystyrene and poly(2-vinylpyridine). The computed IMFPs for these compounds showed greater similarities in magnitude and in the dependences on electron energy than was found in our previous calculations for groups of elements and inorganic compounds (Papers II and III in this series). Comparison of the IMFPs for the organic compounds with values obtained from our predictive IMFP formula TPP-2 showed systematic differences of ∼40%. These differences are due to the extrapolation of TPP-2 from the regime of mainly high-density elements (from which it had been developed and tested) to the low-density materials such as the organic compounds. We analyzed the IMFP data for the groups of elements and organic compounds together and derived a modified empirical expression for one of the parameters in our predictive IMFP equation. The modified equation, denoted TPP-2M, is believed to be satisfactory for estimating IMFPs in elements, inorganic compounds and organic compounds.
    Additional Material: 20 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740210302
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  • 6
    Electronic Resource
    Electronic Resource
    Activities of ISO technical committee 201 on surface chemical analysis (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 615-620 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A status report is given on activities of ISO Technical Committee 201 (ISO/TC 201) on Surface Chemical Analysis. The committee has seven subcommittees which met for the first time in 1993. Information is given on the working groups that have been established for specific purposes. We show national participation in ISO/TC 201 and its subcommittees, and we identify the chairmen and secretariats of the subcommittees and the conveners of the working groups.
    Additional Material: 10 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740210904
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  • 7
    Electronic Resource
    Electronic Resource
    Energy calibration of x-ray photoelectron spectrometers: Results of an interlaboratory comparison to evaluate a proposed calibration procedure (1995)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 121-132 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Results are reported of an interlaboratory comparison conducted to evaluate a proposed procedure for calibration of the binding energy (BE) scales on x-ray photoelectron spectrometers. The calibration was performed at two points on the BE scale (the Au 4f7/2 and Cu 2p3/2 lines) and checks were made of the assumption of BE-scale linearity from measurements on other lines. It is shown here that small offsets (up to ∼0.05 eV) can arise if peaks are located with assumed backgrounds of non-zero slope or if multipeak fits are made to Cu L3VV and Ag M4VV Auger spectra. The two parameters in the linear calibration equation could vary with analyzer pass energy and choice of x-ray source on a particular instrument. Check measurements of the calibrations were performed with the Ag 3d5/2 photoelectron line and the Cu L3VV and Ag M4VV Auger lines; difference between the corrected positions of these lines and the corresponding reference data were satisfactorily small in most cases. For Auger lines excited by monochromatized aluminum x-rays, however, the differences were significant and were interpreted in terms of different average x-ray energies for the monochromated and unmonochromated x-ray sources. The interlaboratory comparison was useful in testing the proposed calibration procedure and in providing guidance for some improvements.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740230302
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  • 8
    Electronic Resource
    Electronic Resource
    The status of reference data, reference materials and reference procedures in surface analysis (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 13 (1988), S. 46-50 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A brief synopsis is given of recent developments and current needs for reference data, reference materials and reference procedures in surface analysis. This assessment is based largely on three presentations and related discussion at the Second Topical Conference on Quantitative Surface Analysis held at Monterey, California on 30-31 October, 1987. While a reasonable start has been made in recent years in providing needed data, materials, and procedures, many important needs remain.
    Additional Material: 1 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740130110
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  • 9
    Electronic Resource
    Electronic Resource
    Calculations of electron inelastic mean free paths (IMFPS). IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP-2 for electron energies between 50 and 2000 eV (1993)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 20 (1993), S. 77-89 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: We have made additional evaluations of the electron inelastic mean free paths (IMFPs) and of the predictive IMFP formula TPP-2 presented in papers II and III of this series. Comparisons have been made with other formulae for the IMFPs and electron attenuation lengths (ALs). We find substantial differences between our IMFP results for 27 elements and 15 inorganic compounds and the AL formulae of Seah and Dench; these differences include different dependences on electron energy and on material parameters. We present IMFP calculations for Al2O3 and GaAs from TPP-2 in which each parameter of the formula is varied in some physically reasonable range about the true value for each compound; these results show the sensitivity of the computed IMFPs to the choices of parameter values. Finally, we give a summary of sources of uncertainty in the IMFP algorithm, in the experimental optical data from which IMFPs are calculated, and of the TPP-2 formula. We conclude that TPP-2 is robust and useful for predicting IMFPs for electron energies and material parameter values in ranges for which the formula was developed and tested.
    Additional Material: 18 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740200112
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  • 10
    Electronic Resource
    Electronic Resource
    Calculations of electron inelastic mean free paths from experimental optical data (1985)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 7 (1985), S. 263-274 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Calculations are reported of inelastic mean free paths (IMFPs) for 100-2000 eV electrons in C, Mg, Al, Al2O3, Cu, Ag, Au, and Bi from experimental optical data. These calculations require knowledge of the momentum-transfer dependence of the differential scattering cross section; this information was taken from Penn's calculations. The calculated IMFPs agree reasonably with direct calculations and with measured electron attenuation lengths (ALs). Since accurate measurements of ALs are difficult, it is suggested that calculations of the present type are useful if the needed optical data are available. The present approach is also useful for materials (such as the transition and noble metals) for which it is not possible to make a meaningful distinction between valence-electron and core-electron excitations as required in current IMFP calculations. The dependence of the calculated IMFPs on electron energy varied with material and was associated with different spectral distributions of the electron energy-loss function. The trend in the dependence of IMFP on energy was similar to that found in analysis of AL data.
    Additional Material: 16 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740070604
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