Electronic Resource
New York, NY [u.a.]
:
Wiley-Blackwell
X-Ray Spectrometry
6 (1977), S. 161-164
ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
A simple method is presented for measuring photoabsorption near the K absorption edge which may provide a new tool for chemical analysis. The excitation is caused by a monochromatic X-ray beam and the emitted characteristic X-rays are monitored as a function of the excitation energy. Simple, thick targets can be studied and only the usual type of fluorescence spectrometer is employed. The K edges of Cr, Ti and V and their compounds are studied and information is found to be available on both the concentration and chemical environment of the studied element. The chemical shifts of the half intensity of the absorption jump are presented.
Additional Material:
7 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300060311
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