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  • 1
    Electronic Resource
    Electronic Resource
    Surface chemical analysis - report on the vamas project (1986)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 9 (1986), S. 79-83 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The VAMAS project on surface chemical analysis is a multi-national cooperation for the provision of standards data and materials for surface chemical analysis measurement and for the provision of the basic understanding necessary for these activities. This project is one of a rapidly growing suite of projects initiated as a result of decisions following the 1982 Versailles Summit Meeting of the Heads of State or Government of Canada, France, Germany, Italy, Japan, UK, USA and the representatives of the Commission of the European Communities. During the past year national representatives to this VAMAS project have been appointed and national committees established. This article summarizes the philosophy, scope, and organization of the project and describes specific activities that have been initiated. Information is given on how individuals, both within and outside the group of member states, may participate.
    Additional Material: 2 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740090202
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  • 2
    Electronic Resource
    Electronic Resource
    Progress of the ASTM E-42 committee on surface analysisUpdated version of an invited paper presented at the International Conference on Quantitative Surface Analysis, held at the National Physical Laboratory, Teddington, UK, 16-17 October 1979. (1981)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 3 (1981), S. 94-98 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The American Society for Testing and Materials (ASTM) formed Committee E-42 on Surface Analysis in 1976. Subcommittees have been established for the four surface-analysis techniques in common use (AES, XPS, ISS, and SIMS) and for terminology, ion-beam sputtering, standard reference materials, and editorial processing. The principal objective of the committee and its component groups is to advance the field of surface analysis and the quality of surface analyses through the development of appropriate standards, standard procedures, standard materials, roundrobins, symposia, workshops, and publications. A review is given of recent activities of the committee and of work in progress. The success of the committee will depend a great deal on adequate communication and coordination with other interested individuals and groups to ensure the adequacy and quality of proposed standards and to prevent unnecessary confusion or duplication of effort. Suggestions are made for this purpose.
    Additional Material: 2 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740030208
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  • 3
    Electronic Resource
    Electronic Resource
    Calculations of electron inelastic mean free paths from experimental optical data (1985)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 7 (1985), S. 263-274 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Calculations are reported of inelastic mean free paths (IMFPs) for 100-2000 eV electrons in C, Mg, Al, Al2O3, Cu, Ag, Au, and Bi from experimental optical data. These calculations require knowledge of the momentum-transfer dependence of the differential scattering cross section; this information was taken from Penn's calculations. The calculated IMFPs agree reasonably with direct calculations and with measured electron attenuation lengths (ALs). Since accurate measurements of ALs are difficult, it is suggested that calculations of the present type are useful if the needed optical data are available. The present approach is also useful for materials (such as the transition and noble metals) for which it is not possible to make a meaningful distinction between valence-electron and core-electron excitations as required in current IMFP calculations. The dependence of the calculated IMFPs on electron energy varied with material and was associated with different spectral distributions of the electron energy-loss function. The trend in the dependence of IMFP on energy was similar to that found in analysis of AL data.
    Additional Material: 16 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740070604
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  • 4
    Electronic Resource
    Electronic Resource
    The NIST x-ray photoelectron spectroscopy database (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 19 (1992), S. 241-246 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The National Institute of Standards and Technology (NIST) has made available the second version of the NIST X-ray Photoelectron Spectroscopy Database. This paper reports on recent upgrades to the database to make the information more up-to-date and to make data searching and display more convenient and efficient for the user. Additional data are included in the database together with the capability to search using large chemical synonym lists, chemical formulae and other chemical classification schemes. A list of reference energies is given for the principal photoelectron and Auger electron lines of most of the elements and these values can be used for calculations of chemical shifts. Pull-down menus are now available to initiate searches for the identification of unknown lines more conveniently, to retrieve data on photoelectron lines, Auger electron lines and chemical shifts for a set of elements, to calculate and display chemical shifts, and to calculate and display information for Wagner plots to identify chemical state. In addition, the use can initiate searches based on specified fields of the database.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740190147
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  • 5
    Electronic Resource
    Electronic Resource
    Calculations of electron inelastic mean free paths (IMFPS). IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP-2 for electron energies between 50 and 2000 eV (1993)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 20 (1993), S. 77-89 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: We have made additional evaluations of the electron inelastic mean free paths (IMFPs) and of the predictive IMFP formula TPP-2 presented in papers II and III of this series. Comparisons have been made with other formulae for the IMFPs and electron attenuation lengths (ALs). We find substantial differences between our IMFP results for 27 elements and 15 inorganic compounds and the AL formulae of Seah and Dench; these differences include different dependences on electron energy and on material parameters. We present IMFP calculations for Al2O3 and GaAs from TPP-2 in which each parameter of the formula is varied in some physically reasonable range about the true value for each compound; these results show the sensitivity of the computed IMFPs to the choices of parameter values. Finally, we give a summary of sources of uncertainty in the IMFP algorithm, in the experimental optical data from which IMFPs are calculated, and of the TPP-2 formula. We conclude that TPP-2 is robust and useful for predicting IMFPs for electron energies and material parameter values in ranges for which the formula was developed and tested.
    Additional Material: 18 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740200112
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  • 6
    Electronic Resource
    Electronic Resource
    Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50-2000 eV range (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 165-176 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: We report calculations of electron inelastic mean free paths (IMFPs) of 50-2000 eV electrons for a group of 14 organic compounds: 26-n-paraffin, adenine, β-carotene, bovine plasma albumin, deoxyribonucleic acid, diphenylhexatriene, guanine, kapton, polyacetylene, poly(butene-1-sulfone), polyethylene, polymethylmethacrylate, polystyrene and poly(2-vinylpyridine). The computed IMFPs for these compounds showed greater similarities in magnitude and in the dependences on electron energy than was found in our previous calculations for groups of elements and inorganic compounds (Papers II and III in this series). Comparison of the IMFPs for the organic compounds with values obtained from our predictive IMFP formula TPP-2 showed systematic differences of ∼40%. These differences are due to the extrapolation of TPP-2 from the regime of mainly high-density elements (from which it had been developed and tested) to the low-density materials such as the organic compounds. We analyzed the IMFP data for the groups of elements and organic compounds together and derived a modified empirical expression for one of the parameters in our predictive IMFP equation. The modified equation, denoted TPP-2M, is believed to be satisfactory for estimating IMFPs in elements, inorganic compounds and organic compounds.
    Additional Material: 20 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740210302
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  • 7
    Electronic Resource
    Electronic Resource
    Energy Calibration of X-ray Photoelectron Spectrometers. II. Issues in Peak Location and Comparison of Methods (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 777-787 
    Details
    ISSN: 0142-2421
    Keywords: XPS ; x-ray photoelectron spectroscopy ; energy calibration ; peak location ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An analysis is presented of issues involved in peak location for the calibration of the binding energy (BE) scales of x-ray photoelectron spectrometers. These issues include the effects of peak asymmetry, the surface core-level shift, and the avoidance of a sloping background when fitting spectra for energy calibration purposes. Examples of uncertainty budgets for BE measurements are then presented in which illustrative values are shown for the repeatability standard deviation (for repeated BE measurements of the same calibration peak), the expanded uncertainty (at the 95% confidence level) for BE measurements following calibrations based on different numbers of peak measurements, and the tolerance for BE-scale drift and non-linearity for two chosen values (±0.1 and ±0.2 eV) of the total expanded uncertainty for a BE measurement (at the 95% confidence level). It is recommended that a user prepare an uncertainty budget of this type to show clearly the sources of random and systematic error in BE measurements following a calibration.The reference data published by the UK National Physical Laboratory for BE-scale calibration were obtained from fits with a quadratic function to a group of points comprising the top 5% of each peak. Most commercial x-ray photoelectron spectrometers have software available for spectrum synthesis, and we consider here the use of the commonly available Lorentzian, Gaussian, and asymmetric Gaussian functions for peak location. Illustrative fits with Cu 2p3/2 spectra (measured with unmonochromated Al x-rays) showed that comparable accuracy and precision could be obtained with Lorentzian and Gaussian functions as with the quadratic-equation method when different fractions of the peak were fitted. For this asymmetrical line, the asymmetric Gaussian function allowed better accuracy and precision to be obtained with a greater fraction of the line than was possible with the symmetrical functions. © 1997 by John Wiley & Sons, Ltd.
    Additional Material: 13 Ill.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Formal databases for surface analysis: The current situation and future trendsInvited paper presented at the Quantitative Surface Analysis (QSA-6) Conference, London, 13-16 November 1990. (1991)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 17 (1991), S. 308-314 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Evaluated data are needed for surface analysis, just as for other measurements, so that analyses can be made reliably and effectively. Until recently, the principal sources of data were handbooks of spectra (mainly of elements) and review articles with values or equations for the parameters needed. This article describes three efforts to develop formal databases that can be incorporated into computer systems. Information is first given on a recently announced x-ray photoelectron spectroscopy database, which contains over 13000 line positions, chemical shifts and splittings, together with associated software for searching by element, line type, line energy and other variables. Second, a summary is presented of a recent compilatation of evaluated elemental ion sputtering yields for applications in sputter depth profiling and secondary ion mass spectrometry. Finally, a description is given of a new database that is to contain Auger electron spectra and x-ray photoelectron spectra; the database architecture is being designed also to accommodate depth profiles and the results of measurements by other surface analysis techniques.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740170603
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  • 9
    Electronic Resource
    Electronic Resource
    Activities of the ASTM committee E-42 on surface analysis (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 19 (1992), S. 237-240 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The ASTM Committee E-42 on Surface Analysis was formed in 1976 to advance the field of surface analysis and the quality of surface analyses through the development of appropriate standards (reference procedures, reference materials and reference data), round robins, symposia, workshops and publications. A major function of the Committee is the development of documentary standards or reference procedures. This article contains a brief summary of Committee activities, with emphasis on the reference procedures that have been published and those that are under development.
    Additional Material: 3 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740190146
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  • 10
    Electronic Resource
    Electronic Resource
    Activities of ISO technical committee 201 on surface chemical analysis (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 615-620 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A status report is given on activities of ISO Technical Committee 201 (ISO/TC 201) on Surface Chemical Analysis. The committee has seven subcommittees which met for the first time in 1993. Information is given on the working groups that have been established for specific purposes. We show national participation in ISO/TC 201 and its subcommittees, and we identify the chairmen and secretariats of the subcommittees and the conveners of the working groups.
    Additional Material: 10 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740210904
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