Library

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A matrix effect correction is required to improve the accuracy of quantitative AES analysis. The correction includes terms involving the atomic density (n), electron back-scattering factor (R) and electron escape depth (L). Many schemes have been proposed by various people for corrections of the R and L terms. However, up to now, there have been no systematic investigations of the correction accuracy of the proposed schemes. We have evaluated the correction accuracy, based on measured intensity data for Au—Cu alloys of different compositions. Comparison was made between the observed intensity ratio K (=Iunk/Istd) and the calculated intensity, ratio K′ (= C(nunk/nstd)(Runk/Rstd)(Lunk/Lstd)), where C and I represent the concentration and intensity, respectively. The superscripts ‘unk’ and ‘std’ denote that the parameters are for unknown and standard specimens, here the pure elements. If the correction works well, the error Er (= K′ — K)/(K) will become smaller. Evaluations were carried out on three schemes for the R correction and on seven schemes for the L correction using the Au 239 eV, Au 2024 eV and Cu 920 eV transitions. The root mean square (RMS) of the calculated errors showed several per cent for the best case and 20-30% for the worst case. The RMS error varied a few per cent between schemes for the R correction but it varied ∼30% for the L correction.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 2
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The Japanese VAMAS-SCA working group is composed of 19 institutes. Three kind of Au—Cu alloys (Au 75 at.-%-Cu 25 at.-%, Au 50 at.-%-Cu 50 at.-%, Au 25 at.-%-Cu 75 at.-%) were prepared, and these specimens, pure Au and pure Cu were distributed to the members of the VAMAS-SCA working group. The surface concentrations of these alloys were calculated from the Auger peak amplitudes in two ways. One method used the published relative sensitivity factors, and the other used pure Au and Pure Cu as the standard materials. The mean values of the surface concentrations calculated with the published relative sensitivity factors were almost the same as those calculated with the standard materials. This means that the published relative sensitivity factors are reliable to some extent. The error of the surface concentration calculated with pure Au and pure Cu as the standard materials lay between about 3% and 10%, and that with the relative sensitivity factors lay between about 7% and 20%. The calculated surface concentrations of Au were larger than the bulk concentrations of Au when the matrix effect was neglected.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 3
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 18 (1992), S. 509-513 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The surface segregation of the substrate element on metal film by diffusion through the film was studied. Six film/substrate couples - Nb/Ti, Ti/Nb, Cu/Nb, Nb/Cu, Cu/Ti and Ti/Cu - deposited by rf magnetron sputtering were applied to investigate segregation behaviour, as well as Nb/Ti and Ti/Nb deposited by electron beam. The segregation behaviour of the substrate element by diffusion through the films was monitored at the film surface by AES. For Nb/Ti, Cu/Nb, Cu/Ti and Ti/Cu, the substrate element segregated on the film surface by diffusing through the film with a diffusion coefficient much larger than that corresponding to volume diffusion in the bulk. The segregation of Cu on Ti film was affected by an exposure of 2.6 × 10-6 Pa oxygen during heating. The activation energy for this diffusion was ∼60% of that in the bulk and the diffusion path seems to be the grain boundaries. The occurrence of this segregation via grain boundary diffusion did not depend on the film preparation process. From these results, the driving force of the segregation via grain boundary diffusion may be the decrease process. From these results, the driving force of the segregation via grain boundary diffusion may be the decrease of the surface free energy of film by the segregation of substrate element on grain boundaries and surfaces of films.
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 4
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 18 (1992), S. 724-728 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In 1990 the Japanese contingent working within the VAMAS framework started to program software in Quick Basic for the IBM-PC or NEC-PC with MS-DOS to translate spectral data acquired on different machines to the VAMAS-SCA Standard Data Transfer Format and to process AES and XPS spectra in a standard manner. We call this software the Common Data Processing System.The Common Data Processing System is designed to be a program to assess the data processing procedures proposed by scientists, to check a spectrum and to build both a spectra and a correction factor data bank. In this system, the spectral data acquired on different instruments and/or computers can be compared to one another.The Common Data Processing System is not commercially produced. It should be perpetuated by scientists and engineers who have an interest in surface analysis.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 5
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The Japanese VAMAS-SCA working group is composed of 19 institutes. Three kinds of Au-Cu alloys (Au25 at%-Cu75 at%, Au50 at%-Cu50 at%, Au75 at%-Cu25 at%) were prepared, and these specimens were distributed to the members of Japanese VAMAS-SCA working group and Auger peak amplitude ratios were measured to clarify the correlation factor of different types of spectrometers. The comparison was carried out by using the relative sensitivity factor for Au and Cu. The relative sensitivity factor for lower energy varied from spectrometer to spectrometer, but that for higher energy did not vary so much. Therefore, to carry out the inter-laboratory comparison of the data, the transfer of the data of peak amplitude at higher energy should be recommended.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 6
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 20 (1993), S. 1061-1066 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A GaAs/AlAs superlattice growth by metal-organic chemical vapour deposition is being proposed as the single crystalline multilayer reference material for sputter depth profiling. This material was characterized by transmission electron microscopy experiments, which showed that the interface between GaAs and AlAs is atomically flat. The preliminary depth profiling experiments were carried out by AES and SIMS.The AES experiments were performed using a Perkin-Elmer SAM 660 scanning Auger microprobe and the SIMS experiments were carried out using a VSW multitechnique XPS/SIMS surface analysis system.The AES and SIMS sputter depth profiling experiments proved that the depth resolution was found to be almost constant for each interface when an Ar+ beam was used for sputtering. Therefore the sputtering-induced roughness is very small for this material with Ar+ beam profiling, the depth resolution deteriorated as a function of depth, indicating oxygen ion beam-induced surface roughening.For both AES and SIMS, the depth resolution improved for ion beams with lower kinetic energy and more glancing angles of incidence.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 7
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 209-216 
    ISSN: 0142-2421
    Keywords: Auger electron spectroscopy ; spectrometer function ; round robin ; Cu spectrum ; parameter fitting ; electron multiplier ; the Common Data Processing System ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The results of a round robin on the energy dependence of detection sensitivity are presented in the framework of the shared software, the Common Data Processing System (COMPRO). This paper aims to give a practical way of checking sensitivity for users who use AES as a tool for their material research and are not necessarily interested in the instrument characteristics but are interested in getting more reliable sensitivity factors. After checking the measurement conditions, a wide range spectrum of Cu (0-2000 eV) was obtained by each participant. Each spectrum has been divided by the ‘reference’ spectrum in the COMPRO. The results of division (the ratio function or the spectrometer function) have been analyzed and fitted by the parameters of the electron multiplier. In the case of pulse counting mode, fitting was very good. In some cases, a step has been found in the ratio function around the peak energy, which made the fitting impossible. In order to give a rough estimation of the energy dependence of sensitivity even in such cases, the way to subtract the origin of a step, which may relate to the internal scattered electron in a cylindrical mirror analyzer, has been studied. It was found that when the intensity (which is proportional to the energy resolution ΔE, which is proportional to E) was subtracted from a raw spectrum intensity, the ratio function calculated from the subtracted spectrum and the ‘reference’ spectrum had a shape which can be fitted by the parameters of the electron multiplier. It also becomes apparent that the misalignment of the sample position or the beam position leads to the wrong spectrometer function and that it is very important to take the spectrum under the optimum condition in order to obtain a reasonable spectrometer function. The routine to divide a spectrum, to load the ‘reference’ spectrum, to fit the spectrometer function with parameters and to calibrate a sample spectrum with the fitting parameters are all supplied in the COMPRO. © 1997 by John Wiley & Sons, Ltd.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 8
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 17 (1991), S. 711-718 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The work of VAMAS-SCA project no. 25 is reported. The project was an XPS round robin with thgree different compositions of Au—Cu alloys (Au 25 at.%,-Cu 75 at.%, Au 50 at.%-Cu 50 at.%, Au 75 at.%-Cu 50 at.%.). These alloys were alson the subject of an earlier AES round robin ( VASMAS-SCA project no. 17). Pure gold and pure copper was used as the standard materials. By using peak areas of the Au 4f doublet and Cu 2p3/2 for the calculation, the effects of measurement conditions and data processing on quantification were examined. The reliability of quantification by three methods, namely the ‘relative sensitivity factors’ method, the ‘pure metals as standard materials’ method and the ‘alloy as standard material’ method, was compared. It is concluded that measurement conditions such as photoelectron emission angle and energy resolution did not affect quantification and that there was no effect of the different background subtraction methods on quantification. With the ‘alloy as standard material’ method, variations of the measured surface concentrations were the smallest, namely ∼2-6%.
    Additional Material: 17 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 9
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 20 (1993), S. 276-282 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The International Prototype of the Kilogram, which is the only artificial material defining one of the fundamental constants, has been reported to gain mass as time elapses after it is cleaned. The surface of a Pt-Ir alloy that has been used for the newer Kilogram prototypes was analysed by XPS and thermal desorption spectroscopy (TDS) to investigate the cause of mass gain, its time dependence and the effect of the cleaning method. The main cause of the mass gain was found to be adsorption of carbon (in the form of hydrocarbons) and oxygen (as water) from the atmosphere. The amounts of the two contaminant elements were almost saturated 6 months after sample cleaning. Cleaning methods do not make a large difference to adsorption behaviour. Although surface iridium is slightly oxidized, this effect is negligibly small.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...