ISSN:
1059-910X
Keywords:
TEM
;
CTEM
;
STEM
;
Electron energy loss spectroscopy (EELS)
;
Energy dispersive X-ray spectroscopy (EDX)
;
Radiation damage
;
Mass loss
;
Lorentz microscopy
;
Life and Medical Sciences
;
Cell & Developmental Biology
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Natural Sciences in General
Notes:
This review discusses some of the work performed by the Solid State Physics Group at Glasgow University. A major aim of the group is to obtain quantitative information with high spatial resolution and to do this reliably requires a thorough understanding of both the instrumentation and the interactions between the electron beam and the specimen. Thus the first part of the review discusses those aspects of instrumentation and techniques that the group has considered in detail while the final part deals with applications which involve the study of a wide range of materials covering metallurgical, semiconductor, organic, and magnetic systems. In all these applications, the results from a range of techniques have been required to provide as complete a picture of the material as possible. © 1993 Wiley-Liss, Inc.
Additional Material:
14 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/jemt.1070240405
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