ISSN:
1572-9567
Keywords:
laser pulse
;
suicide
;
melting
;
phase transition
;
solidification
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract Ti, Fe, and Co silicide layers, 80–200 nm thick, on top of single crystal silicon substrate have been melted by 25-ns ruby laser pulses and the resolidified structures have been analyzed by transmission electron microscopy, X-ray diffraction, and Rurtherford backscattering spectrometry. Metastable phases and/or epitaxial layers are obtained upon solidifcation. The transient molten layer has been monitored by means of time-resolved optical measurements with nanosecond resolution; in all cases solidification velocity of the order of 1 m · s−1 was observed, and in one case liquid undercooling as much as 800 K was estimated.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00566038
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