ISSN:
1573-4889
Keywords:
HIGH-RESOLUTION SIMS
;
TEM
;
ALUMINA SCALES
;
FeCrAl
;
Y SEGREGATION
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract The oxidation behavior of undoped and Y-dopedhigh-purity FeCrAl at 1200°C was investigated. Thescale-growth processes were studied using two-stage16O/18O experiments andhigh-resolution imaging SIMS. SEM, TEM, and scanning transmission electronmicroscopy-electron-dispersive X-ray spectrometry(STEM-EDS) studies were performed in order to determinethe microstructure of the oxide and the chemistry of the metal-oxide interface. An equiaxedα-Al2O3 scale was found togrow by simultaneous outward Al and inward oxygendiffusion on the undoped FeCrAl. In contrast, a columnarα-Al2O3 grain structure on the Y-doped FeCrAl was produced by inwardoxygen diffusion; outward Al diffusion was suppressed.Y was shown to segregate toα-Al2O3 grain boundaries andto the metal-oxide interface.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1018803113093
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