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  • Flux pinning  (1)
  • YBa2Cu3O7−x preparation techniques  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 16 (1994), S. 1917-1924 
    ISSN: 0392-6737
    Keywords: Flux pinning ; flux motion ; fluxon-defect interactions ; Conference proceedings
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Summary Measurements of fundamental and higher harmonics of a.c. susceptibility on polycrystalline high-T c superconductors were carried out using a new method, involving a 2-channel dynamic analyser, allowing 20 harmonics in phase and out of phase to be measured at the same time. The critical-state model, used for describing the higher-harmonics dependence on temperature at fixed d.c. and a.c. magnetic fields, did not explain the experimental results. A frequency analysis indeed suggested that an effect of the fluxon dynamics takes place. Simple considerations lead to the conclusion that really Thermally Activated Flux Flow (TAFF), Flux Creep (FC) and Flux Flow (FF) would have a big role in determining the higher harmonics of a.c. susceptibility. Measurements on low-T c superconductors showed the occurrence of the same effect.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1572-9605
    Keywords: YBa2Cu3O7−x preparation techniques ; microwave surface resistance ; measurement sensitivity
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract We prepared several samples of YBa2Cu3O7−x thick films electrophoretically deposited on metallic substrates, thin films sputtered on dielectric substrates, and bulk pellets, and we tested their microwave properties. Various preparation techniques are described in detail and the importance of appropriate thermal treatment during the fabrication process is emphasized. Experimental results show that electrophoretically deposited thick films on silver substrates reached, after heat treatment, a surface resistance at 50 K of 4×10−2 Ω comparable with the silver value, while the same measurement before sinterization gave a value of 0.5 Ω. Either bulk pellets or thin films gave worse results, though a lack of sensitivity in our experimental apparatus could have influenced our data. The problem of sensitivity in the characterization of microwave properties of small samples is discussed in the appendices.
    Type of Medium: Electronic Resource
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