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Determination of the Se Atom Distribution in the Layered Compound Nb3(Se1-xIx)I7 by Scanning Tunneling Microscopy (1999)

Schmidt, Peter J. ; Thiele, Gerhard ; Whangbo, Myung-Hwan

Weinheim : Wiley-Blackwell

Berichte der deutschen chemischen Gesellschaft 1999 (1999), S. 785-787

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Details

ISSN: 1434-1948

Keywords: Atom distribution ; Mixed crystals ; Scanning tunneling microscopy ; Layered compounds ; Chemistry ; General Chemistry

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Chemistry and Pharmacology

Notes: The layered compound Nb3(Se1-xIx)I7 is obtained when the I atoms at the face-capping sites of the layered compound Nb3I8 are replaced by Se atoms. The amount and distribution of the Se atoms in Nb3(Se1-xIx)I7 were examined by scanning tunneling microscopy. The analysis shows that the distribution of the Se atoms is completely random.

Additional Material: 5 Ill.

Type of Medium: Electronic Resource

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