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  • 1
    Electronic Resource
    Electronic Resource
    Degradation, amorphization, and recrystallization of ion bombarded si(111) surfaces studied by in situ reflection electron microscopy and reflection high energy electron diffraction techniques (1992)
    New York, NY [u.a.] : Wiley-Blackwell
    Microscopy Research and Technique 20 (1992), S. 352-359 
    Details
    ISSN: 1059-910X
    Keywords: Reflected beam ; Amorphization ; Ion bombardment ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: In this paper we report the effect of noble gas ions bombardment on the degradation of atomically flat Si(111) surfaces at room and high (400°C - 600°C) temperatures. Reflection high energy electron diffraction (RHEED) and reflection electron microscopy (REM) have been used to characterize the topography and structure of the as-implanted and post annealed surface layers. It is shown that the fading of the specularly reflected beam is not directly related to the amorphization of the surface. This experimental study has also evidenced the difficulties one meets to regrow a defect-free material after amorphization by noble gas bombardment. For high temperature for which the amorphization is not possible, the surface loses its stepped structure and turns into a monocrystalline but atomically rough surface. This roughness is a function of substrate temperature.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1070200406
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    On the counting of electrons in high voltage electron microscopy (1986)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 3 (1986), S. 135-149 
    Details
    ISSN: 0741-0581
    Keywords: High voltage electron microscopy ; Energy loss spectroscopy ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: This paper describes work on the counting of electrons in high voltage electron microscopy (HVEM). A reliable counting method is needed in order to perform quantitative experiments. A scintillator-photomultiplier device has been adapted to these needs. It has been used here, in the field of electron energy loss spectroscopy. It permits the recording of the totality of the spectrum from the no-loss peak to the inner shell excitation characteristic signals because of a dynamic equal to at least 7. A simple mounting has been made to eliminate the artifacts caused by X-ray pulses. It is shown that HVEM is favourable to the counting of electrons, and some applications are reported.
    Additional Material: 17 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060030112
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Electron microscopy in France, part I: Material science (1989)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 11 (1989), S. 185-185 
    Details
    ISSN: 0741-0581
    Keywords: Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060110302
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Preface (1991)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 18 (1991), S. 335-335 
    Details
    ISSN: 0741-0581
    Keywords: Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060180402
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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