ISSN:
0038-1101
Schlagwort(e):
Electric avalanche breakdown in semiconductors
;
low-temperature scanning electron microscopy
;
nonequilibrium phase transitions
;
nonlinear carrier transport behavior
;
spatial and temporal dissipative current structures
Quelle:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Thema:
Elektrotechnik, Elektronik, Nachrichtentechnik
,
Physik
Materialart:
Digitale Medien
URL:
http://linkinghub.elsevier.com/retrieve/pii/0038-1101(88)90396-6
Permalink