ISSN:
0038-1101
Keywords:
Electric avalanche breakdown in semiconductors
;
low-temperature scanning electron microscopy
;
nonequilibrium phase transitions
;
nonlinear carrier transport behavior
;
spatial and temporal dissipative current structures
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Type of Medium:
Electronic Resource
URL:
http://linkinghub.elsevier.com/retrieve/pii/0038-1101(88)90396-6
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