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Structural evolution during lithiation of sputtered V2O5 films (1995)

Talledo, A. ; Granqvist, C. G.

Springer

Applied physics 60 (1995), S. 521-522

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ISSN: 1432-0630

Keywords: PACS: 66.30; 68.55; 85.40

Source: Springer Online Journal Archives 1860-2000

Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics

Notes: Abstract. Li x VO2.5 films were made by reactive dc magnetron sputtering followed by galvanostatic treatment in LiClO4. Structural evolution for x increasing from zero to ≈ 1, studied by X-ray diffraction, was consistent with a VO5-based layer configuration with progressively increasing layer separation and puckering. Two-phase behavior was found for x 〉 1.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF01538779

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