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  • PACS. 32.70.Jz: Line shapes, widths, and shifts[:AND:] 42.40.Lx: Diffraction efficiency, resolution, and other hologram characteristics - 42.25.Gy: Edge and boundary effects, reflection and refraction  (1)
  • embedded cluster  (1)
Source
Material
Years
Keywords
  • 1
    Electronic Resource
    Electronic Resource
    Electronic structure of rutile (TiO"2)
    Amsterdam : Elsevier
    Journal of Physics and Chemistry of Solids 54 (1993), S. 907-912 
    Details
    ISSN: 0022-3697
    Keywords: Electronic structure ; X"α method ; discrete-variational calculation ; embedded cluster ; rutile
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0022-3697(93)90217-F
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Nonlinear diffraction due to the transient polarization in a thin film of atomic gases* (1998)
    Springer
    The European physical journal 1 (1998), S. 217-221 
    Details
    ISSN: 1434-6079
    Keywords: PACS. 32.70.Jz: Line shapes, widths, and shifts[:AND:] 42.40.Lx: Diffraction efficiency, resolution, and other hologram characteristics - 42.25.Gy: Edge and boundary effects, reflection and refraction
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract: Nonlinear optical response of a thin layer of rarefied atomic vapor is examined by taking into account the atomic motion as well as collisions with the cell walls. Extraordinary pattern of self-diffraction spectrum due to the transient polarization is predicted. It is shown that the spectra are Doppler free and depend strongly upon the vapor thickness. A new possibility of signal enhancement is revealed and a simple device is suggested to enhance greatly the nonlinear reflection signal from a resonant vapor layer.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s100530050083
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
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