ISSN:
1434-6079
Keywords:
PACS. 36.40.-c Atomic and molecular clusters - 61.46.+w Clusters, nanoparticles, and nanocrystalline materials - 82.65.-i Surface and interface chemistry
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract: The cluster ion yields and cluster ion distribution for highly charged ion sputtering have been measured for a uranium oxide target for , and incident ions. The cluster yields exhibit a power law dependence on the cluster size with exponents increasing from -4 to -2.4 with increasing primary ion charge from 44+ to 75+. The power law exponent is also correlated with the total sputter yield.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s100500050320
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