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  • PACS. 71.35.-y Excitons and related phenomena – 73.21.Fg Quantum wells  (1)
  • electron-hole relaxation time  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Solid State Electronics 31 (1988), S. 657-661 
    ISSN: 0038-1101
    Keywords: Electron-phonon relaxation time ; electron-hole relaxation time ; screening of the electron-phonon interaction
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 23 (2001), S. 139-151 
    ISSN: 1434-6036
    Keywords: PACS. 71.35.-y Excitons and related phenomena – 73.21.Fg Quantum wells
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract: Although the exciton in a quantum well is not a rigid ball but distords when its center of mass gets close to a surface, it is mathematically possible to write the exciton energy change from its bulk value as an effective decrease of the well width in which the center of mass would freely move. In the large well limit, the exciton dead layer defined this way is related to the third order term in the expansion of the exciton energy as a function of the inverse well width. A quite precise calculation of this exciton energy is thus necessary to obtain this dead layer. We present a new calculation which relies on a Born-Oppenheimer procedure to decouple the relative motion of the e-h pair from its center of mass motion. This is associated to a quite precise calculation of the relative motion energy, based on our recent work on the exact envelope function for confined motion. We predict that the dead layer increases with the exciton total mass in contradiction with previous results.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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