ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A new and improved type of x-ray capillary optics unit (ellipsoidal), is developed, tested, and characterized using a table-top x-ray microbeam setup. The beam profiles of the x-ray beams generated by the 7.5 μm ellipsoidal capillary were constructed from "knife-edge'' scans across the beam. The detection limits for various elements were determined, and the spatial resolution, when the beam was used in scanning mode, was demonstrated. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145266
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