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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Colloid & polymer science 272 (1994), S. 324-331 
    ISSN: 1435-1536
    Keywords: Surfactants ; silicates ; adsorption ; calorimetry ; x-ray diffraction
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Nonionic surfactants were adsorbed on low-charged layer silicates in the interlayers. After drying, the surfactants were arranged in densely packed double layers. However, in suspension considerably higher basal spacings are measured by x-ray diffraction which indicate that large quantities of non-ionic surfactants are adsorbed. With the aid of calorimetry, enthalpies of displacement were recorded which suggest strong interactions of the non-ionic surfactants with smectites. In analogy to tests on hydrophilic SiO2, the adsorption of smectites is found to depend on the degree of ethoxylation of the non-ionic surfactant. The adsorption declines with increasing EO content.
    Type of Medium: Electronic Resource
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