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  • 1
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 1016-1026 
    ISSN: 0142-2421
    Keywords: XPS analysis ; nanoparticles ; XAS ; EELS ; quantitative characterization of powders ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: For the present study we have considered powders made up of small particles (〈1 μm) coated with a uniform overlayer. Different models have been developed to predict the elemental compositions in this kind of sample by x-ray photoelectron spectroscopy (XPS) and absorption spectroscopies: electron energy-loss spectroscopy (EELS) and x-ray absorption spectroscopy (XAS). Isolated spherical or cubic particles, aggregated spherical particles and continuously layered models have been considered to take different possible textures of the samples into account. Theoretical curves have been compared to experimental data obtained for Al2O3/Al ultrafine powders made up of Al metal cores coated with an Al2O3 overlayer. The dependence of both photoelectron and absorption spectroscopy analysis on overlayer thickness and sample texture as a function of particle size is discussed. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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