ISSN:
1572-9605
Keywords:
Y1−x HoxBa2Cu3O7 −δ
;
films
;
magnetron sputtering
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract Experimental results of research on the influence of deposition temperature (T s) on crystal structure and superconductivity of Y1−x HoxBa2Cu3O7 −δ (YHBCO) films deposited by dcmagnetron sputtering are reported. X-ray diffraction analysis showed that the films grew with preferential orientation of thec-axis normal to the substrate surface in the range of temperature 750–820°C. The single-crystal structure of the YHBCO films grown epitaxially at the optimal substrate temperatures of 820, 800, 760, and 750°C, respectively, have been established by rocking curves, Φ-scan, and electron channeling pattern (ECP). Typical values of the critical current density (A · cm−2) at 77 K and 0.1 T field are 2.1×105, 4×105, 6.2×105, and 3.1×105 for thex=0, 0.2, 0.4, 0.7 films respectively, measured by a Quantum Design magnetrometer (H∥c).
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00723524
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