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  • 1
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 25-35 
    ISSN: 0142-2421
    Keywords: electron inelastic mean free path ; inelastic electron scattering ; calculated IMFP ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Gries has recently reported [Surf. Interface Anal. 24, 38 (1996)] an atomistic model for inelastic electron scattering relevant to Auger electron spectroscopy and x-ray photoelectron spectroscopy and has derived an equation (designated G1) for the estimation of inelastic mean free paths (IMFPs). We present an analysis of the Gries model and the G1 equation in terms of the similarities and differences of inelastic electron scattering by free atoms and by solids. We also compare the G1 equation with our TPP-2M equation for estimation of IMFPs. The former equation was developed from fits to our published IMFPs over the 200-2000 eV energy range, and is identical in its energy dependence to the Bethe equation for inelastic scattering cross-sections and to a simplification of our TPP-2M equation for the same energy range. Comparison of parameters indicates that the Gries fitting parameter k1 should be approximately 0.0016 and 0.0022 for non-transition and transition elements, respectively. We find that the G1 equation could be improved by allowing the Gries fitting parameter k2 to depend on density (as recommended for the equivalent parameter in TPP-2M). Although we believe that the Gries model is inconsistent with current theories for the electronic structure of metals, semiconductors and inorganic compounds, we find (from sum-rule considerations) that the G1 equation can provide an approximate guide to IMFP values. For some compounds, however, there were unexplained deviations (as found by Gries). In contrast to the G1 equation, the TPP-2M equation provides useful IMFP estimates for all materials over the parameter range that has been explored. Gries claims that the G1 equation can be extrapolated to energies lower than 200 eV on the basis of limited agreement with some experimental IMFPs over the 10-100 eV range for Be and the alkali metals, and has questioned the reliability of our IMFPs for energies below 200 eV. We consider this comparison to be inadequate, and we recommend that the G1 equation not be used in the 50-200 eV range. © 1997 by John Wiley & Sons, Ltd.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 606-614 
    ISSN: 0142-2421
    Keywords: XPS ; x-ray photoelectron spectroscopy ; calibration ; Fermi energy ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Calibration of the binding energy scale in x-ray photoelectron spectroscopy (XPS) requires location of the zero point. This zero point has previously been identified with the inflection point in the Fermi-edge region of a valence-band photoemission spectrum of nickel. Comparison of photoemission spectra of nickel and silver measured with monochromated x-rays shows that the inflection points near the Fermi edge differ by 45±5 meV (where the stated uncertainty indicates the standard uncertainty) at an instrumental energy resolution of 0.30 eV. This difference is due to differences in the valence-band densities of states (DOS) of the two metals. Simulations of the Ni photoemission spectrum have been performed based on the DOS calculated by Eckhardt and Fritsche, and the simulated spectrum agrees well with the measured spectrum in the near-edge region. Additional simulations of the Ni photoemission spectrum have been carried out with both monochromated Al x-rays and unmonochromated Mg and Al characteristic x-rays to determine how the Ni near-edge inflection point varies with the energy resolution of the electron energy analyzer in XPS. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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