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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Interface science 4 (1997), S. 99-118 
    ISSN: 1573-2746
    Keywords: diffusion ; interfacial defects ; glide ; climb ; defect interaction
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The diffusional flux associated with the motion of interfacial defects is described by an equation expressed in terms of the topological parameters which characterise defects, namely their Burgers vectors and step heights, the defect velocity and the concentration of each atomic species in the two adjacent crystals. This expression demonstrates that glide/climb behaviour of grain boundary defects is analogous to motion of dislocations in single crystals; climb motion results if a component of b is perpendicular to the interface plane. However, the situation is more complex in the case of interphase interface defects, but the present approach, which considers the step and dislocation portions of defects separately, enables a straightforward analysis. Several examples are illustrated to show the various possibilities, such as climb motion even when b is parallel to the interface, and glide motion when b is not. The latter case arises in martensitic transformation where the existence of an invariant-plane-strain relation at the interface leads to equal and opposite fluxes to the step and dislocation portions of transformation defects so that overall the motion is diffusionless. Interfacial processes involve the motion and interaction of defects. The present analysis facilitates the consideration of diffusive fluxes associated with defect interaction since the step and dislocation portions can be treated independently. A general expression is derived for the total flux arising, and a particular case, the interaction of transformation dislocations with crystal dislocations which have reached the interface during lattice-invariant deformation in martensite formation, is considered.
    Type of Medium: Electronic Resource
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