ISSN:
0887-6266
Keywords:
Polymethylmethacrylate
;
spin casting
;
density profiles
;
neutron reflectivity
;
reflectometry
;
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Chemistry and Pharmacology
,
Physics
Notes:
The density profiles of polymethylmethacrylate (PMMA) thin films on silicon (111) single crystal wafers were investigated via neutron reflectivity measurements. Films were prepared by spin casting PMMA onto silicon wafers from o-xylene solution followed by annealing under vacuum at 90°C for 5 h. A ∼45 Å thick layer at the free polymer surface was observed in the as-prepared samples that has a density about half the value of bulk PMMA. After heating above 110°C, this diffuse layer disappeared and the thin film density profile was transformed to one with a sharp free polymer surface. This transition was found to be irreversible. © 1994 John Wiley & Sons, Inc.
Additional Material:
2 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/polb.1994.090321504
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