Electronic Resource
Springer
International journal of infrared and millimeter waves
1 (1980), S. 45-55
ISSN:
1572-9559
Keywords:
density profiles
;
tokamak
;
electron
;
cyclotron
;
emission
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract Measurement of the line shape of optically thick and optically thin lines in the electron cyclotron radiation spectrum emitted by a tokamak plasma may yield both electron temperature and density profiles. Currently temperature profiles are routinely extracted from optically thick lines. Consequently, this paper is addressed to the density profile problem. Algorithms for extracting density profiles are outlined in the case of uncontrolled reflection and controlled reflection of the cyclotron radiation within the tokamak vacuum chamber.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01007065
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