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  • multiple scattering  (1)
  • rough surface  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Bognor Regis [u.a.] : Wiley-Blackwell
    Journal of Polymer Science Part B: Polymer Physics 36 (1998), S. 1321-1334 
    ISSN: 0887-6266
    Keywords: gloss ; rough surface ; specular reflectance ; correlation length ; Physics ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: A general expression for gloss within the scalar Kirchhoff's theory is derived in terms of the detector collecting angle, and two statistical parameters that characterize the surface roughness. Analytical expressions for gloss are derived for an exponential and a Gaussian correlation function, and numerical results for these and other quasi-exponential correlation functions are presented. It is shown that the incoherent contribution to gloss is significant in common polymeric surfaces. The latter implies that surface height correlations cannot be neglected in the evaluation of gloss. It is also shown that for a correlation function with a single characteristic length, gloss scales with the correlation length Lc in the same way as with the detector collecting angle. This fact can be used to determine Lc with a glossmeter, and an experimental method to achieve this is proposed. © 1998 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 36: 1321-1334, 1998
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    Bognor Regis [u.a.] : Wiley-Blackwell
    Journal of Polymer Science Part B: Polymer Physics 36 (1998), S. 2069-2083 
    ISSN: 0887-6266
    Keywords: PTFE ; fillers ; UV radiation ; degradation ; multiple scattering ; Physics ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: The second part of the series, this article analyzes the way UV light propagates through pure and filled PTFE. We investigated the diffusiveness of the semicrystalline matrix as well as the effect of scattering and absorbing fillers (CaF2 and TiO2) on the attenuation. The UV-visible absorption curves have been determined by spectrophotometry. A theoretical calculation based on a four-flux multiple scattering approach allowed us to satisfactorily reproduce the experimental results, highlighting the respective importance of the coherent and the diffuse fields. In light of this model, we discuss the influence of multiple scattering on the extent of degradation when PTFE is exposed to a high energy UV radiation. This approach provides of a comprehensive view of the damaging effect of UV light on PTFE, showing a good agreement with the experimental results of the previous article. © 1998 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 36: 2069-2083, 1998
    Additional Material: 17 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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