ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Modulation of an ion beam is crucial to several applications in time-of-flight (TOF) mass spectrometry, especially for tandem TOF instruments which require selection of a particular precursor m/z (mass to charge) value prior to fragmentation. Here we present a detailed description of an "interleaved comb'' ion deflection gate device with suitable electronics which offers a performance advantage over the more commonly used deflection plate devices. We demonstrate unit mass resolution for selection to m/z 167 in the tandem TOF instrument constructed in our laboratory. Calculations suggest that the real time of unit resolution for our experimental arrangement is greater than 300. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1146553
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