Electronic Resource
Amsterdam
:
Elsevier
Optics and Laser Technology
17 (1985), S. 208-212
ISSN:
0030-3992
Keywords:
interferometry
;
thickness measurement
;
thin films
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Type of Medium:
Electronic Resource
URL:
http://linkinghub.elsevier.com/retrieve/pii/0030-3992(85)90090-8
Permalink
Library |
Location |
Call Number |
Volume/Issue/Year |
Availability |