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  • 11
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 31 (1998), S. 544-553 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: By crystallization onto an organic substrate such as naphthalene, thin microcrystals of a small organic molecule, such as triphenylene, can be grown. These crystals are less perturbed by shear and erratic bend disorder than the samples produced by rapid growth from dilute solutions. Selected-area electron diffraction intensities are consistent from specimen to specimen, show the symmetry expected for the crystalline projection and, furthermore, correspond to the Fourier transform of the entire unit cell. However, under sampling of the three-dimensional reciprocal lattice by goniometry can frustrate structure determination if conventional direct methods are used. Nevertheless, the crystal structure may still be solved quite accurately by energy minimization.
    Type of Medium: Electronic Resource
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  • 12
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 35 (1979), S. 1001-1009 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The conditions under which direct phasing methods might be used to determine the crystallographic phases from electron diffraction intensity data are investigated through numerical calculations for two organic crystals. The Cowley-Moodie multislice formulation of dynamical diffraction theory is used to calculate the diffraction intensity data for various crystal thicknesses, at electron energies of 100 keV and 1.0 MeV. The direct phasing method is found to give generally correct phases up to a crystal thickness of about 75 Å at 100 keV. The use of higher electron energy (i.e. 1.0 MeV) produces a significant improvement in the success of the direct phasing approach at crystal thicknesses greater than 75 Å.
    Type of Medium: Electronic Resource
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  • 13
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 38 (1982), S. 207-211 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Limiting conditions for the crystal structure analysis of organics using electron diffraction intensity data from elastically bent microcrystals are shown for a representative aromatic structure, cytosine, C4H5N3O. In a projection down the longest unit-cell axis, the normalized structure-factor magnitudes are greatly changed by slight bends, making the diffraction data useless for crystal structure analysis. This alteration of intensity is less severe for a projection down the shortest cell axis and allows a correct structure analysis for bends comparable to those measured experimentally. The correct crystal orientation, moreover, is only achieved by epitaxial growth and not solution growth.
    Type of Medium: Electronic Resource
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  • 14
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 47 (1991), S. 510-515 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Three-dimensional electron-diffraction intensity data from crystalline textures of diketopiperazine (2,5–piperazinedione) published by B. K. Vainshtein in 1955 [Zh. Fiz. Kim. (1955), 29, 327–344] are found to be suitable for ab initio structure analysis via conventional direct phase determination based on the estimates of three- and four-phase structure invariants. Of the 289 non-zero reflections found in this data set, 196 with |E| ≥ 0.5 were used to generate triples and quartets to phase 133 reflections correctly. The resultant [001] and [100] zonal electrostatic potential maps reveal an easily identifiable molecular structure and the atomic coordinates are close to the values found in an X-ray crystal structure.
    Type of Medium: Electronic Resource
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  • 15
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 49 (1993), S. 677-678 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Type of Medium: Electronic Resource
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  • 16
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 50 (1994), S. 258-259 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Type of Medium: Electronic Resource
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  • 17
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 50 (1994), S. 344-351 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The crystal structure of C60 buckminsterfullerene was determined at room temperature by a direct phasing analysis of single-crystal electron-diffraction intensity data. The initial electrostatic potential map is well fit by a regular icosahedron of C atoms but with an average rotational disorder corresponding to Fm3m symmetry. The static appearance of this directly determined map, however, does not refute the notion of uncorrelated molecular positions in the crystal lattice, indicated earlier by nuclear-magnetic resonance spectroscopy and neutron scattering. Although the direct determination of crystallographic phases is correct, the occurrence of strong axial h00 reflections in the electron diffraction patterns appears to be a result of secondary scattering. Correction for this perturbation produces a good fit of the intensities to an isotropic spherical shell of C atoms. In fact, the static appearance of the initial potential map is artificial, owing to the use of only a limited set of phased structure factors in the Fourier transform carried out after the ab initio structure analysis.
    Type of Medium: Electronic Resource
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  • 18
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 51 (1995), S. 869-879 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A recent simulation has attempted to evaluate the validity of direct phasing and Fourier techniques in electron crystallography. In response to this study, experimental electron diffraction data from copper perchlorophthalocyanine collected at 1200 kV were re-assessed to determine the most important deviation of these intensities from the single-scattering approximation. While n-beam dynamical scattering has indeed been observed for these electron diffraction intensities (in agreement with the simulation) and has been shown to be important for selection of data suitable for ab initio structure analysis, it is, however, not the major perturbation to data obtained at very high voltages. Rather, a simple correction for secondary scattering provides the best fit to the experimental data, an observation consistent with the analyses of other organic structures. Thus, in order to justify the use of electron diffraction intensities from any substance for an ab initio structure determination, it is, first of all, requisite that the actual conditions used for the diffraction experiment be closely modeled.
    Type of Medium: Electronic Resource
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  • 19
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 48 (1992), S. 562-568 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Electron diffraction intensity data were collected at 1200 kV from thin epitaxically oriented crystals of copper perbromophthalocyanine (C32Br16CuN8) in a projection down molecular columns. Measured cell constants for the projection with cmm symmetry are d100 = 17.88 (9), b = 26.46 (15) Å. The structure was determined by Fourier refinement after three heavy-atom positions were identified in an initial potential map. In addition to the copper and halogens, all light-atom positions were found. Although the final R value for all data is 0.41, n-beam dynamical calculations for crystal thicknesses corresponding to the estimated sample dimension account for the observed amplitudes that deviate most from their kinematical values.
    Type of Medium: Electronic Resource
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  • 20
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 52 (1996), S. 480-489 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Zonal diffraction amplitudes and crystallographic phases, derived from an averaged electron micrograph of two-dimensionally crystalline E. coli Omp F outer membrane porin (plane group p31m, a = 72 Å), embedded in glucose, were used as a model data set to test the feasibility of direct phase extension and ab initio direct phase determination. If 17 phase terms derived from e.g. a 10 Å (diffraction) resolution image are expanded to 6 Å by the Sayre–Hughes equation, the unknown phases are found with reasonable accuracy (mean error 43° for 25 reflections). This, however, is not the most optimal starting point. As a function of initial image resolution, the accuracy of the phase extension to 6 Å is approximately a parabolic function. That is, an optimal basis resolution, found at 11 Å (i. e. 14 defined reflections), produces a least mean error of 18° for 28 new reflections. In addition, ab initio phase determination is possible via a multisolution technique, using a test for density flatness as a figure of merit. The success of the determination, again, is sensitive to the size of the starting basis set generated from the permuted unknown reflections. If an annealing step is used to improve the basis set, the test for flatness will identify which reflections should be changed in phase. However, this figure of merit is not absolutely reliable for finding the exact value of the unknown phases.
    Type of Medium: Electronic Resource
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