Electronic Resource
Springer
International journal of infrared and millimeter waves
16 (1995), S. 339-348
ISSN:
1572-9559
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract Beryllium, when introduced into silicon by thermal diffusion, gives rise to several acceptor impurity centers. The infrared absorption spectrum of beryllium in silicon has been measured with a Fourier-transform spectrometer. The absorption spectrum observed clearly shows five different beryllium acceptor centers in silicon.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF02096321
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