ISSN:
1662-9752
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
The crystallographic slip activity in several grains deformed by simple tension isdetermined by use of in-situ deformation in combination with Electron Back Scattering Diffraction(EBSD)-investigations and Secondary Electron (SE) imaging. This technique is also used todetermine grain lattice rotation paths of grains with different initial orientation, providinginformation on basic deformation mechanisms of grains present in texture gradients. Both slipactivity and grain lattice rotation paths depend on the initial orientation and are influenced by theneighbouring grain orientations. This indicates that predictions of the forming behaviour ofextruded profiles with a strong through thickness texture gradient relate to a very complex nature
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/13/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.519-521.809.pdf
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