ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A new system for low-energy electron diffraction (LEED) intensity measurements has been developed using a video camera and digital processing of the video signal. Complete two-dimensional LEED patterns are digitized in real time with high resolution using a commercial video processor. Intensity-voltage (I-V) data on all beams in complex LEED patterns are collected simultaneously. A microcomputer analysis program automatically tracks the diffraction beams as a function of energy and calculates beam position, size, and integrated intensity, including a local background correction. Using a video tape recorder for intermediate data storage, a complete set of I-V curves can be collected in less than 100 s.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1138983
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