ISSN:
1435-1536
Keywords:
Key words Dielectric spectroscopy
;
FT-IR spectroscopy
;
Mesoporous materials
;
MCM-48
;
Al-MCM-48
;
Ti-MCM-48
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Broad-band dielectric spectroscopy was used to investigate the dielectric properties of the meso- porous materials MCM-48, Al-MCM-48 and Ti-MCM-48. The samples were examined in the frequency range from 20 Hz to 1 MHz and in the temperature range from −100 to 250 °C. The dielectric relaxation of the materials has a complex nonexponential behavior with some common features for all the samples. The dielectric spectroscopy and Fourier transform IR measurements identified the relaxation process related to percolation of H+ ions associated with silanol groups and water adsorbed in the materials. The non-Debye behavior of the macroscopic dipole correlation functions related to the percolation process allowed us to extract the fractal dimensions of the paths of excitation transfer within the porous medium, and the porosity of each sample was estimated.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s003960050549
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