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  • 1
    Electronic Resource
    Electronic Resource
    A study on pinned layer magnetization processes in different antiferromagnetic coupling systems of spin-valves (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 5729-5731 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this paper we report on magnetization reversal processes of pinned layers in different ferromagnetic and anti-ferromagnetic bilayer and spin-valve structures by observing hysteresis, switching field distribution (SFD), and time-dependent effects. The fact that time-dependent coercivity Hc tendency is more pronounced in ordered AF materials than that of disordered AF materials implies a spin reversal of some AF grains with locally low pinning field and low blocking temperature. We propose a simple qualitative model to explain our results in terms of a distribution of the pinning reversal field and temperature in AF layer, which may be due to a grain size distribution in the AF layer and an incomplete and inhomogeneous phase transformation in some ordered AF materials. High resolution electron microscopy (HREM) results reveal that lattice spacing does change from place to place in AF region of some ordered AF materials. The evidence indicates an incomplete and inhomogeneous phase transformation in the ordered AF systems, supporting the results of the magnetization reversal process study. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372503
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  • 2
    Electronic Resource
    Electronic Resource
    Variation of magnetoresistive sensitivity maps of patterned giant magnetoresistance sensors (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 6769-6771 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A scanning probe microscope which combines probe contacts for the supply of current with a magnetic force microscope (MFM) for fully automated imaging of electrically active, patterned sensor-like devices across a wafer was developed. This was used for magnetoresistive sensitivity mapping (MSM) of giant magnetoresistive sensors with different stabilization schemes. Multiple measurements of sensors showed that the MSM images were very repeatable. The complex image patterns varied significantly from sensor to sensor across a wafer. With MFM tips magnetized perpendicular to the ferromagnetic films in the sensor, MSM signals at the top and bottom of the sensor were significantly more intense than signals at the sensor interior. Results from micromagnetic calculations were found to be consistent with the experimental observations. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1364499
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    Paper (German National Licenses)
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