ISSN:
1432-0630
Keywords:
61.80
;
66.30
;
42.70
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract The Rutherford backscattering technique was used to characterize the purposedly added cesium impurities in soda-lime glass. The impurities were introduced into the glass matrix by an ion-exchange diffusion process at room temperature. The diffusion coefficient of cesium was determined from the measured depth profiles. The diffusion of the cesium impurities stimulated by 280 keV Kr+-ion beam irradiation was also studied. The depth distributions obtained are discussed using the model of radiation enhanced diffusion. Results are compared with theoretical values based on transport of ions in matter calculations and other experimental work.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00331404
Permalink