ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Noise voltage and noise current measurements have been carried out at different temperatures on two kinds of low-noise silicon J-FET at moderately high frequencies up to 100 kHz. We have made careful noise current measurements by constructing a very low-loss superconducting resonator working in the kHz frequency range, whose quality factor reaches 3×105. At 10 kHz, the measured noise energy lies between 1.1 and 1.8×10−24 W/Hz for both types of transistors, but the ratio between the noise voltage and the noise current exhibits pronounced differences depending on the device under test.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1142218
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