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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Analytical chemistry 27 (1955), S. 7-11 
    ISSN: 1520-6882
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 1564-1568 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin iron overlayers on ferromagnetic samples are shown to be nonintrusive probes of the magnetization of the underlying sample when using spin-polarized secondary-electron emission for domain microscopy. Domain images of the iron overlayer show that the local magnetization direction is indicative of that in the sample. The magnitude of the spin polarization, however, reflects the magnetization of the iron overlayer. Thus, for materials with low spin polarization, the iron overlayer provides a large signal enhancement. The method is also applicable to oxidized transition-metal surfaces. The iron film is found to be exchange coupled to the substrate across oxide layers on the sample surface. These points are demonstrated in experiments with an Fe〈100〉 whisker and with a Co-Ni alloy magnetic disk.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Recently, there has been much interest in the noise characteristics of recording media.1 These characteristics have not been completely explained by current theoretical models.2 This paper reports on the noise characteristics as a function of write current and its correlation with written bits as observed by SEMPA.3–5 CoNiCr film sputtered on Al-based NiP substrate was used for this study. The grain structure of this sample was obtained by high-resolution SEM, and the magnetic microstructure was observed by utilizing the SEMPA technique. The saturation magnetization MS and coercivity HC for this film are 731 emu/cc and 794 Oe, respectively. The noise measurements show that as the write current is increased from zero, a well-defined noise maximum is observed at a write current of about 8.5 mA o-p. With further increase in write current, noise voltage decreases to a minimum at about 14 mA o-p, and then rises again showing a secondary, broad noise maximum at a write current of about 34 mA o-p. The SEMPA images of the written transitions at those three write currents of 8.5, 14, and 34 mA o-p have been obtained. These SEMPA images show a strong correlation with the noise behavior of this media. At the first noise maxima, where the signal amplitude is high, the magnetized regions show some cross links and the transition region shows irregularities. For the intermediate write current where noise is low, the cross links between the magnetized regions are minimal. At the secondary maximum, where the readback signal amplitude is very low, the magnetized regions are heavily overlapped and there is practically no identifiable transition regions as observed by SEMPA. The micromagnetic structure of a reverse dc erase track at the noise maximum has also been observed by SEMPA and will be reported along with the noise data.5 The details of this paper appear in Ref. 5.〈ks〉
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 5835-5839 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The decay of the spin polarization of low-energy secondary electrons from Fe+ oxygen is measured as a function of oxygen exposure. We conclude that the spin polarization data can be explained through a simple model in which the spin polarization of secondary electrons generated from the oxide is small. From this, we determine, that the escape depth for spin-polarized electrons is approximately 29±3 A(ring) at 2 eV kinetic energy, decreasing to approximately 22±2 A(ring) at 7 and 12 eV. These results indicate that spin-polarization measurements on Fe and its oxide are less surface sensitive than previously thought.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 2016-2022 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Empirical forms have been found for the total and differential elastic scattering cross sections for electron/atom scattering. The cross sections are valid over the range 0.1–30 keV and across the periodic table. The empirical forms of the cross sections are derived from trends in tabulated Mott scattering cross sections. The form of the total cross section is similar to a previously published cross section and is based on the screened Rutherford cross section. The fit to the differential Mott cross sections is decomposed into two parts, one part being of the same mathematical form as the screened Rutherford cross section σR, and the second part being an isotropic distribution σI. These two mathematical forms were chosen because they give a straightforward generation of random scattering angles. The screened Rutherford part of the differential scattering cross section is first fitted to the half-angle of the Mott cross sections. This fit of the differential screened Rutherford is in turn reduced to a fit of the screening parameter alone over energy and atomic number. The screened Rutherford part of the cross section is highly peaked in the forward scattering direction and needs to be balanced by the isotropic distribution.The ratio of the total cross sections (σR/σI) between the screened Rutherford part of the differential scattering cross section and the isotropic part of the distribution is then fitted to give the same ratio of forward to backscattered currents as the tabulated Mott differential cross sections. Using this dual form of the scattering cross section for the differential cross section, and the previously (independently) fitted total cross section, the backscattering coefficients for normal incidence are calculated. The two equations describing the differential cross section, one for the Rutherford screening parameter and one for the ratio σR/σI, are simplified to remove redundant parameters, and then fitted to the backscattering coefficients calculated directly from the tabulated Mott cross sections. A straightforward expression for the differential cross section was found to give backscattering results covering all the major trends with energy and atomic number compared to the backscattering coefficients calculated using tabulated Mott cross sections.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 58 (1991), S. 2845-2847 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: For high atomic numbers the total cross section for electron-atom elastic scattering calculated using the partial-wave method is found to fall into two regimes over the range 1–100 keV. The cross section in the higher energy regime scales as E−1, and in the lower energy regime as E−0.5. An empirical equation has been drawn up that describes these trends, and can give a universal expression for the cross sections over the Periodic Table to allow economical Monte Carlo simulation of electron scattering over a wide range of energies and materials.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 1686-1689 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The capabilities of a direct imaging photoelectron microscope (MicroESCA from Surface Science Instruments) have been demonstrated in a set of experiments carried out at the Stanford Synchrotron Radiation Laboratory (SSRL) using a torroidal grating monochromator in the photon energy range 20–170 eV. Photoelectrons from a 300×300 μm2 sample area are projected in the diverging magnetic field of a superconducting solenoid and an image reflecting the variation in photoelectron yield is recorded digitally with a resistive anode imaging detector. Lateral resolution is better than 5 μm. A retarding field analyzer located in front of the imaging detector acts as a high-pass filter and allows us to obtain a series of spectrally resolved images which can be processed to give a spot XPS analysis of areas as small as 5×5 μm2. Images from a sample of patterned aluminum on silicon are presented to demonstrate the potential of the instrument.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 3430-3433 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The value of spin-polarized electron micrographs may be enhanced dramatically by the use of statistical image analysis techniques. These techniques can be used to display the vectorial nature of spin polarization data and give images of the highest magnetic contrast. The resulting images are free of the difficulties of interpretation inherent in the conventional dual grey-scale imaging technique and allow for quantification of the spatially resolved spin-polarized signal. The techniques are illustrated using the results from a Fe-4% Si crystal surface.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Annals of the New York Academy of Sciences 135 (1966), S. 0 
    ISSN: 1749-6632
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Natural Sciences in General
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Industrial & engineering chemistry 45 (1953), S. 1516-1520 
    ISSN: 1520-5045
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
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