Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
56 (1985), S. 1568-1572
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A new ultramicrohardness tester for a load range between 2×10−2 and 5×10−5 N is described. The instrument is operated inside a scanning electron microscope. Load is applied and measured by means of electrical signals thus making fully automized experiments possible. Typical examples demonstrate the capability of the device and the general problem associated with ultra-low-load hardness testing. With experiments on thin films the complex situation for testing layered structures is shown and suggestions for a proper evaluation are given.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1138154
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