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  • 1
    Electronic Resource
    Electronic Resource
    Epitaxial growth and characterization of Y2Co17(0001) thin films deposited on W(110) (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 997-1003 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Y2Co17(0001) was grown on W(110) by pulsed laser deposition. The structural and morphological features of the films as a function of substrate temperature and thickness were studied in situ by means of reflection high-energy electron diffraction, and ex situ by means of scanning electron microscopy, transmission electron microscopy, and x-ray analysis (diffraction and reflection). Different growth modes were observed depending on the experimental conditions. They are discussed by considering the kinetical properties of the deposit and the thermodynamical properties of the system. The magnetic properties of the films have been investigated and related to the structural analysis. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360294
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  • 2
    Electronic Resource
    Electronic Resource
    Strain and shape analysis of multilayer surface gratings by coplanar and by grazing-incidence x-ray diffraction (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 3744-3758 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The surface shape and the spatial distribution of strain in GaInAs/InP multilayer gratings is experimentally determined by combining high-resolution x-ray diffraction and grazing-incidence diffraction. Dramatic deformations of the diffraction patterns in the measured reciprocal space maps of such gratings indicate a strongly nonuniform character of lattice distortions in the layers, caused by elastic strain relaxation. By coupling x-ray diffraction theory and elasticity theory within one single evaluation formalism, an experimental strain and shape analysis could be performed which was not yet available in this form by other methods. The different components of the strain tensor are determined by recording diffraction patterns around different reciprocal lattice points. We study how the strain relaxation of the multilayer grating evolves towards the free surface, and how the local strain distribution is modulated due to the compositional profile of the layered setup. Furthermore, the article describes in detail the effects of the grating shape, the multilayer morphology, and the lattice strain field on the diffraction patterns of multilayered gratings. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372409
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  • 3
    Electronic Resource
    Electronic Resource
    X-ray diffraction reciprocal space mapping of a GaAs surface grating (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 62 (1993), S. 1623-1625 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A GaAs surface grating (period 574 nm) is analyzed by four crystal-six reflection x-ray diffraction. Two-dimensional measurements in the vicinity of the 004 GaAs reciprocal lattice point show satellites in the transverse direction related to the periodicity of the grating. A cross pattern, centered on the 004 GaAs reciprocal lattice point, is formed by these satellites. An explanation is given by a model which includes the influence of transmission through the surface pattern on the substrate diffraction.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.108606
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  • 4
    Electronic Resource
    Electronic Resource
    Investigation of the compositional depth profile in epitaxial submicrometer layers of AIIIBV heterostructures (1988)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 21 (1988), S. 386-392 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The compositional depth profile in semiconductor heterostructures can be determined from X-ray diffraction patterns. Different grading profiles were studied through theoretical simulations with regard to their features in the rocking curve. It was found that the thickness and the grading of a particular layer cannot be determined independently of each other. A linear grading gives rise to an increased peak width of the layer diffraction peak whereas an exponential grading can be detected from the damping of high-order interference fringes. The exponential model can be applied to determine the abruptness of the heterointerfaces. The proposed evaluation method of experimental rocking curves includes the case of overlapping peaks of the layer and the substrate diffraction. The simulation results are discussed for a GaAs/Ga1−xAlxAs/GaAs[001] double heterostructure. When the experimental resolution is taken into account, the sensitivity of the interface width determination was 100–200 Å.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889888003188
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  • 5
    Electronic Resource
    Electronic Resource
    Extreme asymmetric X-ray Bragg reflection of semiconductor heterostructures near the edge of total external reflection (1990)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 23 (1990), S. 228-233 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Synchrotron radiation has been used to measure the rocking curves from a (GaIn)(AsP) single layer grown on an InP (100)-oriented substrate. For angles of incidence ΦB = (ΘB − φ) ≤ 0.7° measured at the Bragg angle ΘB (φ is the angle between the diffracting lattice plane and the surface), the rocking curve (RC) is very strongly influenced by total external reflection (TER). This causes a decrease in the full width at half-maximum (FWHM) and an asymmetrical shape for the RC for small ΦB. Both of these effects are due to the Bragg-angle shift from the actual incident angle Φ which is not considered in the conventional dynamical theory. In this paper the essential influence of TER on any thin-layer rocking curve is investigated using a numerical solution of the extended dynamical theory. The pattern can be interpreted up to ΦB ≥ ΘC (ΘC is the angle of TER) by semiempirical incorporation of the results of the extended theory with the coupling formalism of Barrels, Hornstra & Lobeek [Acta Cryst. (1986). A42, 539–545].
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889890001704
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