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  • 1
    Electronic Resource
    Electronic Resource
    Method to characterize the vibrational response of a beetle type scanning tunneling microscope (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 124-128 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe a method for analyzing the external vibrations and intrinsic mechanical resonances affecting scanning probe microscopes by using the microscope as an accelerometer. We show that clear correlations can be established between the frequencies of mechanical vibrational modes and the frequencies of peaks in the tunnel current noise power spectrum. When this method is applied to our "beetle" type scanning tunneling microscope (STM), we find unexpected low frequency "rattling resonances" in the 500–1700 Hz range that depend on the exact lateral position of the STM, in addition to the expected mechanical resonances of the STM above 4 kHz which are in good agreement with theoretical estimates. We believe that these rattling resonances may be a general problem for scanning probe microscopes that use some type of kinetic motion for coarse positioning. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147845
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Scanning tunneling microscope with continuous flow cryostat sample cooling (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 2479-2485 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have constructed an ultrahigh vacuum scanning tunneling microscope (STM) for operation in the temperature range 20–300 K. The design consists of a vibration isolated sample holder mounted on a continuous flow cryostat. By rotation and linear motion of the cryostat, the sample can be positioned in front of various surface preparation and analysis instruments contained in a single vacuum chamber. A lightweight beetle-type STM head is lowered from the top onto the sample by a linear manipulator. To minimize helium convection in the cryostat, the entire vacuum system, including a liquid helium storage Dewar, can be tilted by a few degrees perpendicular to the cryostat axis, which improves the operation. The performance of the instrument is demonstrated by atomically resolved images of the Pd(111) surface and adsorbed CO molecules. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148172
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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