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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 4910-4912 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have investigated the structural and magnetic properties of sputter-deposited Ti/Co multilayer thin films. Sample composition was determined by Rutherford backscattering spectrometry. The crystal structure and composition modulation were examined with several x-ray diffraction techniques. X-ray diffraction analysis showed that the Ti and Co layers grow in the hcp structure and that the films are strongly textured along the (002) direction and are structurally incoherent. Composition modulation was confirmed from low-angle x-ray diffraction measurements. Vibrating-sample magnetometry (VSM) and Brillouin light scattering (BLS) were used to determine the magnetic properties of the films. VSM measurements of samples with Co layer thicknesses less than ≈22 A(ring) showed no measurable net magnetization, while those with greater Co layer thicknesses had both in-plane and perpendicular components. Using a simple model, the measured thickness dependence of the magnetization can be explained by assuming that 11.3 A(ring) of Co at each Ti interface is nonmagnetic with bulk magnetization for the remaining Co. Perpendicular volume and interface anisotropy constants obtained from the VSM data were Ks=0.23 erg/cm2 and Kv=3.5×106 erg/cm3, respectively. Excellent agreement was obtained between the best fit magnetic parameters for the VSM and the BLS data.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 63 (1988), S. 2176-2178 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Mo/Ta superlattices with superlattice wavelengths in the range 20–180 A(ring) were made by alternately sputtering these components. We present the results of a variety of x-ray diffraction studies used to structurally characterize these samples.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 5757-5759 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Copper/cobalt multilayers were deposited by magnetically enhanced dc triode sputtering onto single-crystal sapphire substrates. According to the binary-phase diagram, no stable alloys of copper and cobalt exist. Because the multilayers are not exposed to high temperatures, we expect no alloy formation at the interfaces. X-ray diffraction techniques demonstrate crystalline layering existing down to monolayer thicknesses of copper and cobalt. The saturation magnetization behavior of the multilayers was modeled using the perpendicular and in-plane hysteresis curves obtained using a vibrating sample magnetometer. A torque magnetometer was used to determine the net magnetic anisotropy. Here we discuss the correlation between the magnetic behavior and the structural properties.
    Type of Medium: Electronic Resource
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