Electronic Resource
Zhou, Ping
;
Rao, A. M.
;
Wang, Kai-An
;
[et al.]
Robertson, J. D.
;
Eloi, C.
;
Meier, Mark S.
;
Ren, S. L.
;
Bi, Xiang-Xin
;
Eklund, P. C.
;
Dresselhaus, M. S.
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
60 (1992), S. 2871-2873
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Using Raman scattering we have observed a phototransformation of C60 films on Si(100) from a face-centered-cubic (fcc) phase to a second solid phase leaving the C60 molecules intact. Furthermore, photoassisted oxygen diffusion into the deep bulk is detected using alpha resonance scattering. The Raman spectrum for oxygen-doped C60 is found to be similar to the result for oxygen-free fcc C60, and oxygen is found to harden the film against phototransformation.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.106828
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