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Study of the first-stage relaxation in ZnTe/(001)CdTe strained layers (1994)

Eymery, J. ; Tatarenko, S. ; Bouchet, N. ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 64 (1994), S. 3631-3633

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Details

ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: The first stages of the growth of highly strained ZnTe on (001) CdTe are studied in details by reflection high-energy electron diffraction analysis. Below the critical thickness, small lattice oscillations attributed to a nontetragonal elastic distortion are observed on a system in tensile stress. An effect of Zn excess pressure on the critical thickness is demonstrated. Exposure at 280 °C of the CdTe(001) surface under Zn flux leads to the formation of a c(2×2) Zn terminated surface with about 50% Zn coverage. Such a pretreatment reduces the critical thickness by about half a monolayer.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.111227

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