Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
57 (1985), S. 1698-1704
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Preparation of high quality Nb/ZrOx/Pb and Nb/TiOx/Pb Josephson tunnel junctions based on single-crystal niobium thin films is reported. Vm values up to 70 mV, as measured at 4.2 K, were obtained as a result of thermal oxidation of the freshly coated surfaces. The specific capacitance of these junctions varies from 0.010–0.022 pF/μm2, as determined from Fiske modes and the Josephson diffraction patterns. The use of added thermally oxidized metallic coatings on single-crystal Nb surfaces is shown to modify the tunneling parameters systematically and to offer new possibilities for fabricating all refractory metal Josephson devices.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.334440
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