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  • 1
    Electronic Resource
    Electronic Resource
    Time-resolved reflectivity studies of the GaAs(100)/oxide and GaAs(100)/ZnSe interface (1991)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 59 (1991), S. 1476-1478 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A series of subpicosecond time-resolved reflectivity measurements on n-type GaAs(100) interfaces at photoexcitation densities of 1018 cm−3 is reported. It is observed that the temporal dependence of the reflectivity signal within the first several picoseconds following photoexcitation is highly dependent upon interface preparation. The surface of the GaAs was prepared in several ways: by the growth of a thermal oxide overlayer, a photochemically passivated oxide overlayer, and an epitaxial ZnSe overlayer.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.105292
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Time domain terahertz impulse ranging studies (1995)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 1960-1962 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present time domain impulse scattering measurements of freely propagating terahertz radiation measured with subpicosecond resolution. This fast time response corresponds to a usable bandwidth of over 1 THz. Measured scattered fields from thin wire targets agree well with the calculated scattering for the early and late time response in both the time and frequency domains. Realistic ranging from scale model aircraft is demonstrated. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.114579
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  • 3
    Electronic Resource
    Electronic Resource
    Properties of surface waves determined via bistatic terahertz impulse ranging (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 1146-1148 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A bistatic terahertz impulse ranging system has permitted the full isolation and direct measurements of the surface wave loss and dispersion for terahertz frequencies on a dielectric cylinder. This system permits ranging investigations with variable bistatic angles between the source and detector. Direct, frequency dependent comparisons of surface wave loss and propagation velocity are compared to Mie theory and previous measurements of surface wave propagation over a 1 THz bandwidth. The observed radiation from the surface waves is seen to depend on the path of the radiation in and along the scatterer. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1350418
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Direct observation of the Gouy phase shift in THz impulse ranging (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 670-672 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Here we present a direct observation of the Gouy effect through THz impulse scattering from cylindrical and spherical targets. A π/2 Gouy phase shift through a one-axis focus compared to the more common π phase shift of the two-axis focus is required to interpret the scattering results using a physical optics model. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.125857
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  • 5
    Electronic Resource
    Electronic Resource
    Time resolved synthetic aperture terahertz impulse imaging (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 4485-4487 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using a well characterized terahertz (THz) impulse ranging system we demonstrate broad bandwidth imaging at THz frequencies using an inverse synthetic aperture deconvolution technique. The system demonstrates millimeter and submillimeter resolutions along the cross range and range axes, respectively. The range resolution, determined by the THz pulse bandwidth is 0.12 mm, while the cross range resolution is 1.2 mm; both resolutions agree well with theoretical predictions. Through imaging of cylindrical targets we demonstrate quantitative measurement of target position in the image plane within the experimental error of 0.2 mm. Imaging of geometrically scaled complex targets is demonstrated for a 1:2400 scale model ship (1 mm=24 m) corresponding to a full scale frequency bandwidth of 83–625 MHz at a distance of 840 m. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1427745
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  • 6
    Electronic Resource
    Electronic Resource
    Characterization of thin polymer films using terahertz time-domain interferometry (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 875-877 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An interferometer for broadband single-cycle THz pulses is developed based on the Michelson configuration. Total internal reflection of THz pulses in high-resistivity silicon prisms provides a nearly 180° phase shift of one arm relative to the other to achieve destructive interference. We show that due to automatic compensation for laser fluctuations by the interferometer, it is possible to measure the index and absorption of thin-film samples with more accuracy than is achievable with standard THz time-domain spectroscopy. We demonstrate characterization of the complex index of refraction of 2 μm thick Mylar (polyester) films. By measuring the signal amplitude directly in the time domain, the interferometer can be used for rapid measurements of film thickness with a resolution of better than 1 μm. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1389823
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    Paper (German National Licenses)
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