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  • 1
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 90 (1989), S. 2834-2835 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Emission spectra of SiF3 radical were observed from photodissociative excitation of SiF4 at 99.1, 95.5, and 92.3 nm. The spectra show a broad visible band in the 350–800 nm region, a UV band in 290–340 nm, and a weak band in 240–280 nm. The visible band resembles the chemiluminescence spectra observed from etching of silicon by F or XeF2.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 90 (1989), S. 3318-3331 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: CH2I2 molecules adsorbed on Al2O3 and Ag surfaces are used as model systems for studying the photofragmentation and desorption processes on solid surfaces involving electronic excitation of the adsorbate. The molecules are activated into an antibonding state by a ultraviolet (UV) light pulse and the desorption behavior is monitored by time-of-flight mass spectrometry. The surface coverage and chemical changes due to laser irradiation are determined by x-ray photoemission and thermal desorption spectroscopies. The desorption yields as well as the mass and the translational energy distributions are measured as a function of the surface coverage, the laser fluence, and the number of laser pulses. The UV radiation effect on a mixture of CH2I2 and NH3 as coadsorbates on Al2O3 is also examined. The results reveal the characteristic electronic, thermal, and "explosive'' desorption effects depending on both the gaseous exposure and the laser irradiation conditions. The quantum yields, the molecular selectivities, the energetics of dissociation and the desorption mechanisms are discussed based on the experimental observations. For clarity, the results and analyses are presented in two parts: CH2I2/Al2O3 in paper I and CH2I2/Ag in paper II of this series.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 90 (1989), S. 3332-3338 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The adsorbate- and the substrate-mediated chemical processes induced by ultraviolet (UV) laser pulses have been identified for the CH2I2/Ag system. In contrast to CH2I2 on Al2O3, little photodissociation or desorption is observed for the molecules adsorbed on an Ag surface at submonolayer coverages. Photochemical effect is evident at coverages higher than a monolayer. Explosive desorption dominates at high surface coverages and high laser fluences. The explosive behavior is elucidated and its implications relevant to material ablation by lasers is discussed.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 86 (1987), S. 1152-1156 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The photoabsorption and fluorescence cross sections of SiF4 were measured in the 49–120 nm region using synchrotron radiation as a light source. Absorption bands were tentatively assigned to Rydberg states and their oscillator strengths were determined. The fluorescence was dispersed to identify the emitting species. In the 49–58 nm region, the emitter is attributed to the excited SiF+4 (D˜) ion. In the 92–98 nm region, the fluorescence is likely produced by the excited SiF@B|3 radical. Photodissociation process of SiF4 in the extreme ultraviolet region is discussed.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Journal of the American Chemical Society 96 (1974), S. 6828-6831 
    ISSN: 1520-5126
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Journal of Inorganic and Nuclear Chemistry 27 (1965), S. 1655-1662 
    ISSN: 0022-1902
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology , Energy, Environment Protection, Nuclear Power Engineering
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 41 (1986), S. 209-221 
    ISSN: 1432-0630
    Keywords: 79.20.Ds ; 82.50.Et ; 82.65.Nz
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Time-resolved mass spectrometry is used to study the desorbed species due to laser-induced etching of a solid CuCl and a chlorinated Cu surface. The observed desorption threshold, mass distribution and kinetic energies of the desorbed atoms and molecules at 355 and 532 nm radiation show that the laser-induced etching process is not simply thermal evaporation. It is suggested that competing nonthermal mechanisms due to electronic excitations may be very important in laser-induced desorption and etching. These processes are different for a solid CuCl and a chlorinated Cu surface. For laser-induced etching of Cu surfaces, chlorination of Cu is essential; however, formation of stoichiometric CuCl is not necessary. Excess Cu in the surface layer is responsible for the observed different etching behavior of a chlorinated Cu and a solid CuCl surface. The effect of laser radiation on these surfaces and possible etching mechanisms are discussed based on the experimental observations.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 45 (1988), S. 277-288 
    ISSN: 1432-0630
    Keywords: 82.50.Et ; 82.65.Nz
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The photoetching behavior of poly(methylmethacrylate), poly(dimethylglutarimide) and chlorinated poly(methylstyrene) doped with pyrene and 4-aminobenzoylhydrazide excited by 308 nm excimer-laser pulses has been studied. Some common laser-etching characteristics including the reduction of the threshold fluence for ablation, the enhancement of etching efficiency and the existence of optimal conditions regarding the laser fluence and dopant concentration for generating clean and smooth etching patterns are identified. The photoetching mechanism and the potential application of the doping technique to material processing are discussed.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 5 (1998), S. 299-304 
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The Synchrotron Radiation Research Center (SRRC) and the Institute of Atomic and Molecular Sciences (IAMS) have initiated a project to construct a scanning photoelectron spectromicroscopy end station at SRRC (SRRC-SPEM). High-brightness soft X-rays will be provided by the U5 undulator beamline. Zone-plate-based soft X-ray optics will be used to focus the beam to form the microprobe. A hemispherical sector analyser with multichannel detection capability will collect the photoelectrons. A total of up to 32 images can be acquired concurrently. The apparatus is also equipped with a sample distribution system for in situ sample preparation and characterization in conjunction with other surface spectroscopic techniques.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 33 (1998), S. 5221-5228 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract An analysis of the single-fiber fragmentation test was investigated.An approximate solution for the stress fields of a fiber embedded in a polymer matrix of different elastic moduli was obtained by the Eshelby method. The fiber was modeled as a prolate spheroid. The axial stress of the fiber increases with increasing aspect ratio and fiber-matrix shear modulus ratio and decreases with increasing matrix and fiber Poisson's ratios. Using this analysis, the fracture stress of a single-fiber fragmentation specimen was derived. The applied stress at fiber fracture decreases monotonically with increasing aspect ratio of the fragmented fiber and increases with increasing fiber and matrix Poisson's ratios. This model is in qualitative agreement with published experimental data.
    Type of Medium: Electronic Resource
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