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  • 1
    Electronic Resource
    Electronic Resource
    Near-field photocurrent measurements on boron-implanted silicon (2002)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 3937-3939 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report near-field photocurrent (NPC) measurements performed on three boron-implanted silicon samples characterized by different implantation doses. The images were acquired at λ=1330 nm corresponding to a photon energy of 0.93 eV which is smaller than the silicon energy gap (Egap=1.12 eV), representing incident radiation to which silicon is virtually transparent. The NPC images reveal the presence of boron clusters which are a consequence of B implantation and rapid thermal annealing at 1100 °C for 30 s. Boron clusters behave as metal clusters embedded into the silicon matrix and introduce gap states which give rise to the observed photocurrent. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1446654
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  • 2
    Electronic Resource
    Electronic Resource
    A multipurpose scanning near-field optical microscope: Reflectivity and photocurrent on semiconductor and biological samples (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 3240-3244 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A multipurpose scanning near field optical microscope (SNOM) operating at ambient pressure is described with the aim of characterizing the inner parts of biological molecules and any semiconductor or metal microstructure. Therefore, in addition to the requirements of reliability and mechanical stability we have carefully considered analyzing a sample with all available geometries for input/output of photons, in order to get as much information as possible. The SNOM unit consists of two separable cylindrical supports; the lower one contains the sample holder mounted on top of a piezoelectric scanner which is contained in a motor controlled x-y-z stage. A piezo-modulated stretched optical fiber with a few tens of nanometer pinhole and a shear-force apparatus mounted inside the top cylinder allow for topography measurements. The reflectivity of the sample can be measured by applying different methods: the sample can be illuminated on top by an external source, as well as by the optical fiber used for the detection of the reflectivity signal. An aperture in the lower cylinder allows for illumination of the sample on the back: in this case the fiber collects the evanescent wave induced at the top of the sample. Another aperture in the lower cylinder allows measurement of the reflected light which includes a contribution due to the interaction with the fiber. Also photocurrent experiments can be easily performed by illuminating the sample with the fiber and detecting the transmitted signal using a current–voltage converter mounted inside the top cylinder. A video-camera that can reach 170 enlargements is mounted on the top cylinder for positioning the fiber on particular regions of the sample. Reflectivity and photocurrent measurements have been performed on uncoated neurons, CsI compound, Au/GaAs, and PtSi/Si systems, reaching a resolution well below the diffraction limit. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1149089
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  • 3
    Electronic Resource
    Electronic Resource
    PC-based digital apparatus with temperature compensation for measurement of thin films during deposition (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 2952-2953 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We present an apparatus for controlling the deposition of thin films. The apparatus is based on a quartz resonator whose frequency is controlled digitally by a computer. Temperature variations of the quartz during the evaporation process, attributed to the exothermic heat of condensation and radiation heating from the evaporation source, are compensated. A very stable deposition rate and a good film thickness evaluation are obtained.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144339
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  • 4
    Electronic Resource
    Electronic Resource
    A flexible implementation of scanning probe microscopy utilizing a multifunction system linked to a PC-Pentium controller (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 3799-3802 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A flexible electronic setup on a PC platform and the software implementation in Windows Microsoft environment, for a multipurpose head for scanning probe microscopy (SPM), has been developed. The integrated, multiapplication data acquisition system is linked to a PC-Pentium controller, through a digital I/O board, and consists of: (i) an asynchronous acquisition for real time removal of following error from SPM images; (ii) a three-axes, computer controlled micropositioning stage; (iii) software for electronic control, data acquisition, and graphics elaboration performed through subroutines of Visual Basic (Visual Basic Programming System Professional edition for Windows is a registered trademark of Microsoft Corporation, USA.), and PV-WAVE personal edition. (PV-WAVE Personal edition for Windows is a registered trademark of Visual Numerics, USA.) © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148029
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  • 5
    Electronic Resource
    Electronic Resource
    Preparation and characterization of tungsten tips for scanning tunneling microscopy (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 1558-1560 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Tungsten tips obtained through electrochemical etching have been characterized by scanning electron microscopy, scanning Auger microscopy, and scanning tunneling microscopy. While such tips resulted to be very sharp, a thick oxide layer (∼10 nm) is present at the apex. High-vacuum annealing at 1800 K removes most of such oxide.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144891
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  • 6
    Electronic Resource
    Electronic Resource
    Free-electron-laser near-field nanospectroscopy (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 151-153 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: First experiments at the Vanderbilt free electron lasers measured the local reflectivity of a PtSi/Si system. The reflectivity in the scanning near-field optical microscope images revealed features that were not present in the corresponding shear-force (topology) images and which were due to localized changes in the bulk properties of the sample. The size of the smallest detected features clearly demonstrated that near-field conditions were reached. The use of different photon wavelengths (0.653, 1.2, and 2.4 μm) enabled us to probe regions of different depth. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.121739
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  • 7
    Electronic Resource
    Electronic Resource
    Atomic force microscopy detects transient frictional contrasts in apoptotic cells induced by deprivation of interleukin-3 (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 1143-1145 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The morphological changes of murine hematopoietic 32D Cl3-A cell line, in which apoptosis was induced by deprivation of interleukin-3 (IL-3) from the culture medium, were studied through air operating atomic force microscopy. The subtraction of IL-3 determines the appearing of blebs on plasma membrane and cell fragmentation in several residual bodies. Areas of strong contrast in the friction images, which are nearly absent in control and necrotic cells, were detected with percentage that peaks at 6 h of IL-3 deprivation. These are the results revealing that transient modification of the plasma membrane accompanies the first steps of apoptosis pathway. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1350976
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  • 8
    Electronic Resource
    Electronic Resource
    Electronic properties of α-Sn(100)2×1: Evidence for asymmetric dimer reconstruction (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 3032-3034 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A well-ordered thick layer of α-Sn(100) has been grown on InSb(100). The low energy electron diffraction pattern showed a sharp 2×1 double domain reconstruction with very low background at room temperature. The electronic properties have been studied by core-level- and angle-resolved photoemission spectroscopy (ARPES). ARPES spectra showed the presence of a surface state at normal emission, 1.15 eV below the Fermi level. This state disperses downward 1.3 eV along the [010] direction. Core-level spectra are well fitted with three surface-shifted components at binding energies +0.22, −0.23, and −0.49 eV with respect to the bulk component. Such results are in agreement with theoretical calculations based on asymmetric dimers by [Z.-Y. Lu, G. Chiarotti, S. Scandolo, and E. Tosatti, Phys. Rev. B 58, 13698 (1998)], taking into account final state effects, and exclude the existence of symmetric dimers. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1369416
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  • 9
    Electronic Resource
    Electronic Resource
    Modifications of human lymphoblastoid cells induced by low-frequency magnetic field: A three-dimensional atomic-force microscopy study (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 3145-3147 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Air operating atomic force microscopy has been used to study human B lymphoblastoid (Raji) cells exposed to a 50 Hz 2 mT sinusoidal magnetic field (MF), up to 64 h. A statistical analysis performed on mean height and membrane roughness of the cells showed a loss of microvilli and several modifications of the overall shape and membrane surface at increasing MF exposure. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1371785
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  • 10
    Electronic Resource
    Electronic Resource
    Atomic force microscopy study of erythrocyte shape and membrane structure after treatment with a dihydropyridinic drug (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 3650-3652 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The overall shape and membrane surface of human erythrocytes (RBCs) in the presence of nifedipine (a dihydropyridinic drug used in the clinical treatment of hypertension and angina pectoris) were imaged by contact-mode atomic force microscopy. Nifedipine induces in RBCs relevant morphological changes the extent of which increases as a function of drug concentration and incubation time. The modifications have been interpreted as mainly due to insertion of nifedipine into the outer layer of the RBC membrane. The potential effect of nifedipine as a hemoglobin denaturant has been ruled out by x-ray absorption near-edge structure and optical spectroscopies. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.126736
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