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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 5742-5744 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report evidence for an ordered flux line lattice in a 2-μm epitaxial film of YBaCuO from both neutron depolarization and diffraction measurements. Depolarization occurred when field cooling was done normal to the film plane but not within it; this is consistent with frozen-in vortices. Evidence for ordering of the flux lines comes from intensity maxima observed in difference patterns between field cooled and zero field cooled conditions.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 4542-4544 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The depolarization of a neutron beam passing through a sample of the high-Tc superconductor YBa2Cu3O7−δ has been measured as a function of temperature and applied field. The difference in behavior between field-cooled and zero-field-cooled states, the observation of hysteresis correlated with Hc1, and the disappearance of the effect near 55 K (below Tc) suggest an explanation in terms of vortex line lattice formation with possible connection to recently proposed flux line entanglement and melting.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 43 (1987), S. 638-645 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The resolution function for Mössbauer γ-ray scattering and the thermal diffuse scattering (TDS) near the 444 reflection in silicon have been measured with high-intensity Mössbauer radiation from the 46.48 keV transition in 183W. A general analysis of the resolution function has been carried out for the first time which shows that its energy and momentum components can be factored independently with the energy resolution being determined by the Mössbauer resonance. The half-widths of the momentum resolution ellipsoid were measured to be 0.011, 0.11 and 1.13 Å-1 in the transverse, longitudinal and vertical directions, respectively. The ratios of these half-widths are significantly different from those commonly encountered in neutron scattering. These analyses indicate that the observed broad distribution of inelastic scattering in the TDS profiles is consistent with published elastic constants for silicon.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1572-9540
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Using 100 Ci183Ta and 5 Ci182Ta sources, with LiF and NaCl crystal monochromating filters, we have measured the lineshape parameters for the 46.5 keV and 99.1 keV Mossbauer effect (ME) transitions of183W and the 100.1 keV transition of182W. Using an analytic representation of the convolution integral and utilizing asymptotic analyses of the lineshape, we find, for both transmission and microfoil internal conversion (MICE) experiments, accurate values of all ME parameters including width, position, cross section, and interference. This new approach allows deconvolution of source and absorber spectra and gives a simple analytic expression for both as well as their Fourier transforms. The line widths for the 46.5, 99.1, and 100.1 keV transitions are 3.10(10), 0.369(18), and 0.195(12) cm/s, respectively. The interference parameters are −0.00257(9), −0.0093(12), and −0.0107(12) in the same respective order. The agreement between transmission and MICE /1,2/ measurements for the above lineshape parameters is within the experimental errors. We believe these measurements are the first having sufficient precision to allow a quantitative comparison with dispersion theory /3,4/ and they indicate interference parameters 10 to 20% smaller than predicted. Our measured line widths are less than earlier reported values. This is because our analysis of the true lineshape and the study of line asymptotics permits a quantitative determination of the isomer lifetimes rather than the usual lower bound found in earlier ME experiments.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Hyperfine interactions 29 (1986), S. 1517-1520 
    ISSN: 1572-9540
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The Mossbauer diffraction instrument at the Missouri University Research Reactor has been used to measure the elastic and inelastic contributions to the 444 Bragg reflection in dynamic silicon at room temperature. These measurements used the 46.5-keV gamma rays from high intensity183Ta sources cooled to liquid nitrogen temperature. The main feature of this study compared to similar measurements on silicon is the significantly improved momentum space resolution. ΔQ values of 0.011 Å−1 and 0.11 Å−1 were measured for the transverse and longitudinal directions, respectively.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Springer
    Hyperfine interactions 29 (1986), S. 1513-1516 
    ISSN: 1572-9540
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Using exceptionally high intensity Mössbauer sources (∼ 1–100 Ci) of182Ta and183Ta, we have measured the Mössbauer effect for the 46.5 and 99.1 keV transitions of183W and the 100.1 keV transition of182W. Using a microfoil internal conversion electron (MICE) /1/ detector capable of operation at low temperatures, and a LiF crystal monochromator, we obtain effects of nearly 600% for the 46.5 keV transition and 3 1/2% and 6% for the other two cases, while standard transmission measurements typically yield much smaller signal-to-background ratios. With this technique we have measured the asymmetry term in the conversion electron spectra. To our present level of accuracy the results are in agreement with theoretical calculations of interference parameters /2/. Our results do not agree with earlier measurements /3/ on this transition, which are grossly at variance with theoretical calculations of the interference parameter.
    Type of Medium: Electronic Resource
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  • 7
    ISSN: 1572-9540
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Type of Medium: Electronic Resource
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